Chemical Etching of InP and InGaAsP / InP

© 1982 ECS - The Electrochemical Society
, , Citation Sadao Adachi 1982 J. Electrochem. Soc. 129 609 DOI 10.1149/1.2123935

1945-7111/129/3/609

Abstract

A new system has been developed that is particularly suitable for use in etching solutions of and heterostructure wafers. This system provides high quality etched surfaces without any undesirable roughness or etch pits. Etching rates for vary from 0.1 to 10 μm/min, depending on the component proportion of the solutions and/or on the normal of aqueous solution. Mesa‐shaped structures have been formed on etching stripes in parallel to the [110] and [110] directions. The etchant system has almost equal etching rates for both and , and thus provides desirable mesa‐shaped structure with high quality etched surfaces and with good resist‐pattern definitions. The solution does not erode photoresists, and is thereby attractive for a variety of device applications.

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