Juan M. Díez
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- Influence of manufacturing variations in IDDQ measurements: a new test criterion
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Reliabilty, Test, and IDDQ Measurements
IDDQ '97: Proceedings of the 1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)IDDQ measurements are strongly identified with CMOS IC testing, however IDDQ also has long term links to IC reliability. This paper overviews the association of reliability and IDDQ testing. Three reliability topics are discussed: fundamental failure ...
Estimation of NBTI Degradation using IDDQ Measurement
Proceedings of the 2007 IEEE International Reliability Physics Symposium Proceedings. 45th AnnualNegative bias temperature instability (NBTI) has emerged as a major reliability degradation factor in nano-scale CMOS technology. In this paper, we analyze the impact of NBTI degradation in both the maximum operating frequency (fMAX) and the total ...
Characterizing within-die variation from multiple supply port IDDQ measurements
ICCAD '09: Proceedings of the 2009 International Conference on Computer-Aided DesignThe importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding characterization circuits in product chips. In this work, we propose a ...
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