Mengyun Liu
Krishnendu Chakrabarty
ABSTRACT
Resistive Random Access Memory (RRAM) and RRAM-based computing systems (RCS) provide energy-efficient technology options for neuromorphic computing. However, the applicability of RCS is limited by reliability problems that arise from the immature fabrication process. In order to take advantage of RCS in practical applications, fault-tolerant design is a key challenge. We present a survey of fault-tolerant designs for RRAM-based neuromorphic computing systems. We first describe RRAM-based crossbars and training architectures in RCS. Following this, we classify fault models into different categories, and review post-fabrication testing methods. Subsequently, online testing methods are presented. Finally, we present various fault-tolerant techniques that were designed to tolerate different types of RRAM faults. The methods reviewed in this survey represent recent trends in fault-tolerant designs of RCS, and are expected motivate further research in this field.
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- Fault tolerance in neuromorphic computing systems
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