Semiconducting Electronic Property of Graphene Adsorbed on (0001) Surfaces of SiO2

Thanh Cuong Nguyen, Minoru Otani, and Susumu Okada
Phys. Rev. Lett. 106, 106801 – Published 7 March 2011

Abstract

First-principles total energy calculations are performed to investigate the energetics and electronic structures of graphene adsorbed on both an oxygen-terminated SiO2 (0001) surface and a fully hydroxylated SiO2 (0001) surface. We find that there are several stable adsorption sites for graphene on both O-terminated and hydroxylated SiO2 surfaces. The binding energy in the most stable geometry is found to be 15 meV per C atom, indicating a weak interaction between graphene and SiO2 (0001) surfaces. We also find that the graphene adsorbed on SiO2 is a semiconductor irrespective of the adsorption arrangement due to the variation of on-site energy induced by the SiO2 substrate.

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  • Received 8 September 2010

DOI:https://doi.org/10.1103/PhysRevLett.106.106801

© 2011 American Physical Society

Authors & Affiliations

Thanh Cuong Nguyen1,3, Minoru Otani1,3, and Susumu Okada2,3

  • 1Nanosystem Research Institute (NRI), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Japan
  • 2Graduate school of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8571, Japan
  • 3Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan

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Issue

Vol. 106, Iss. 10 — 11 March 2011

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