Identification of the dominant nitrogen defect in silicon

R. Jones, S. Öberg, F. Berg Rasmussen, and B. Bech Nielsen
Phys. Rev. Lett. 72, 1882 – Published 21 March 1994
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Abstract

The structure of the dominant N pair defect in Si is determined from channeling, infrared local vibrational mode spectroscopy, and ab initio local density functional theory. Channeling experiments show that the N atoms are displaced by 1.1±0.1 Å from lattice sites along 〈100〉. Annealing experiments reveal that this N site is associated with two N-related local vibrational modes originating from the N pair. The ab initio calculations demonstrate that the pair consists of two neighboring 〈100〉 oriented N-Si split interstitials, arranged in an antiparallel configuration, and with four N-Si bonds forming a square lying on {011}.

  • Received 15 November 1993

DOI:https://doi.org/10.1103/PhysRevLett.72.1882

©1994 American Physical Society

Authors & Affiliations

R. Jones

  • Department of Physics, University of Exeter, Exeter, EX44QL, United Kingdom

S. Öberg

  • Department of Mathematics, University of Luleå, S95187, Sweden

F. Berg Rasmussen and B. Bech Nielsen

  • Institute of Physics and Astronomy, University of Aarhus, DK-8000, Århus C, Denmark

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Vol. 72, Iss. 12 — 21 March 1994

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