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Erschienen in:
2015 | OriginalPaper | Buchkapitel
Failure of Integrated Circuits
verfasst von : Lawrence E. Murr
Erschienen in: Handbook of Materials Structures, Properties, Processing and Performance
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Abstract
Although there are many complex, integrated, and interactive systems such as automobiles, aircraft, electrical generation, and distribution systems, integrated circuits and especially very-large-scale integrated (VLSI) and ultra-large-scale integrated (ULSI) device systems demonstrate a length-scale system, in contrast, which is unique because of its continuous evolution. This evolution, driven for roughly four decades by Moore’s law, involves feature sizes driven to the low-nanometer-size regime and transistor densities exceeding billions/cm2. Electromigration is discussed in the context of these phenomena along with related circuit failure phenomena as these relate to product reliability.