AFM topographies of densely packed nanoparticles: a quick way to determine the lateral size distribution by autocorrelation function analysis

The distribution of sizes is one of the basic characteristics of nanoparticles. Here, we propose a novel way to determine the lateral distribution of sizes from AFM topographies. Our algorithm is based on the autocorrelation function and can be applied both on topographies containing spatially separated and densely packed nanoparticles as well as on topographies of polycrystalline films. As no manual treatment is required, this algorithm can be easily automatable for batch processing. The algorithm works in principle with any kind of spatially mapped information (AFM current maps, optical microscope images, etc.), and as such has no size limitations. However, in the case of AFM topographies, the tip/sample convolution effects will be the factor limiting the smallest size to which the algorithm is applicable. Here, we demonstrate the usefulness of this algorithm on objects with sizes ranging between 20 nm and 1.5 μm.