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A Low TC Voltage Reference Generator Suitable for Low Temperature Applications Read chapter Read first chapter

2018 | OriginalPaper | Chapter

An Efficient Model for Soft Error Vulnerability of Dynamic Circuits

Authors : Yan Sun, Yuesheng Cao, Jinwen Li, Tiejun Li

Published in: Computer Engineering and Technology

Publisher: Springer Singapore

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Abstract

Dynamic circuits are widely used in high-speed circuit. However, dynamic circuits are very vulnerable to soft errors. An analytical model of critical charge for vulnerable nodes of dynamic circuits is developed. As the accurate model is too complex to calculate, a simplified efficient model is proposed by using an approximate method. Proposed model are verified by SPICE simulation and error analysis respectively. Results demonstrate that these models have high accuracy and can be used both in the efficient analysis and automatic CAD tools.

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previous chapter Research of Configurable Hybrid Memory Architecture for Big Data Processing
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Metadata
Title
An Efficient Model for Soft Error Vulnerability of Dynamic Circuits
Authors
Yan Sun
Yuesheng Cao
Jinwen Li
Tiejun Li
Copyright Year
2018
Publisher
Springer Singapore
Book
Computer Engineering and Technology

Print ISBN: 978-981-10-7843-9

Electronic ISBN: 978-981-10-7844-6

Copyright Year: 2018

DOI
https://doi.org/10.1007/978-981-10-7844-6_13