Skip to main content
Top
Published in: The International Journal of Advanced Manufacturing Technology 9-10/2004

01-05-2004 | Original Article

C pm MPPAC for manufacturing quality control applied to precision voltage reference process

Authors: W. L. Pearn, M. H. Shu, B. M. Hsu

Published in: The International Journal of Advanced Manufacturing Technology | Issue 9-10/2004

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

A multiprocess performance analysis chart (MPPAC), based on the process capability index C pm , called C pm MPPAC, is developed to analyse the manufacturing quality of a group of processes in a multiple process environment. The C pm MPPAC conveys critical information about multiple processes regarding the departure of the process and process variability on one single chart. Existing research on MPPAC has been restricted to obtaining quality information from one single sample of each process, ignoring sampling errors. The information provided from the existing MPPAC chart, therefore, is unreliable and misleading, resulting in incorrect decisions. In this paper, the natural estimator of C pm is considered based on multiple samples. Based on the natural estimator of C pm , sampling errors are considered by providing an explicit formula with Matlab to obtain the estimation accuracy of the C pm . The sampling accuracy of C pm is tablulated for sample size determination so that engineers/practitioners can use it for in-plant applications. An example of multiple PVR processes is presented to illustrate the applicability of C pm MPPAC for manufacturing quality control.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference Kane VE (1986) Process capability indices. J Qual Tech 18(1):41–52 Kane VE (1986) Process capability indices. J Qual Tech 18(1):41–52
2.
go back to reference Hsiang TC, Taguchi G (1985) A tutorial on quality control and assurance—the Taguchi methods. ASA Annual Meeting, Las Vegas, Nevada, USA Hsiang TC, Taguchi G (1985) A tutorial on quality control and assurance—the Taguchi methods. ASA Annual Meeting, Las Vegas, Nevada, USA
3.
go back to reference Chan LK, Cheng SW, Spiring FA (1988) A new measure of process capability: C pm . J Qual Tech 20:162–173 Chan LK, Cheng SW, Spiring FA (1988) A new measure of process capability: C pm . J Qual Tech 20:162–173
4.
go back to reference Ruczinski I (1996) The relation between C pm and the degree of inclusion. Doctoral dissertation, University of Würzburg, Würzburg, Germany Ruczinski I (1996) The relation between C pm and the degree of inclusion. Doctoral dissertation, University of Würzburg, Würzburg, Germany
5.
go back to reference Singhal SC (1990) A new chart for analyzing multiprocess performance. Qual Eng 2(4):379–390 Singhal SC (1990) A new chart for analyzing multiprocess performance. Qual Eng 2(4):379–390
6.
go back to reference Singhal SC (1991) Multiprocess performance analysis chart (MPPAC) with capability zones. Qual Eng 4(1):75–81 Singhal SC (1991) Multiprocess performance analysis chart (MPPAC) with capability zones. Qual Eng 4(1):75–81
7.
go back to reference Pearn WL, Chen KS (1997) Multiprocess performance analysis: a case study. Qual Eng 10(1):1–8 Pearn WL, Chen KS (1997) Multiprocess performance analysis: a case study. Qual Eng 10(1):1–8
8.
go back to reference Pearn WL, Ko CH, Wang KH (2002) A multiprocess performance analysis chart based on the incapability index C pp : an application to the chip resistors. Microelectron Reliab (in press) Pearn WL, Ko CH, Wang KH (2002) A multiprocess performance analysis chart based on the incapability index C pp : an application to the chip resistors. Microelectron Reliab (in press)
9.
go back to reference Chen KS, Huang ML, Li RK (2001) Process capability analysis for an entire product. Int J Prod Res 39(17):4077–4087CrossRef Chen KS, Huang ML, Li RK (2001) Process capability analysis for an entire product. Int J Prod Res 39(17):4077–4087CrossRef
10.
go back to reference Kirmani SNU, Kocherlakota AK, Kocherlakota S (1991) Estimation of σ and the process capability index based on sub-samples. Commun St Th 20(1):275–291 Kirmani SNU, Kocherlakota AK, Kocherlakota S (1991) Estimation of σ and the process capability index based on sub-samples. Commun St Th 20(1):275–291
11.
go back to reference Vännman K (1997) Distribution and moments in simplified form for a general class of capability indices. Commun St Th 26:159–179 Vännman K (1997) Distribution and moments in simplified form for a general class of capability indices. Commun St Th 26:159–179
12.
go back to reference Boyles RA (1991) The Taguchi capability index. J Qual Tech 23:17–26 Boyles RA (1991) The Taguchi capability index. J Qual Tech 23:17–26
13.
go back to reference Pearn WL, Kotz S, Johnson NL (1992) Distributional and inferential properties of process capability indices. J Qual Tech 24(4):216–231 Pearn WL, Kotz S, Johnson NL (1992) Distributional and inferential properties of process capability indices. J Qual Tech 24(4):216–231
14.
go back to reference Kotz S, Johnson NL (1993) Process capability indices. Chapman & Hall, London Kotz S, Johnson NL (1993) Process capability indices. Chapman & Hall, London
15.
go back to reference Vännman K, Kotz S (1995) A superstructure of capability indices—distributional properties and implications. Scand J Stat 22:477–491 Vännman K, Kotz S (1995) A superstructure of capability indices—distributional properties and implications. Scand J Stat 22:477–491
Metadata
Title
C pm MPPAC for manufacturing quality control applied to precision voltage reference process
Authors
W. L. Pearn
M. H. Shu
B. M. Hsu
Publication date
01-05-2004
Publisher
Springer-Verlag
Published in
The International Journal of Advanced Manufacturing Technology / Issue 9-10/2004
Print ISSN: 0268-3768
Electronic ISSN: 1433-3015
DOI
https://doi.org/10.1007/s00170-003-1688-9

Other articles of this Issue 9-10/2004

The International Journal of Advanced Manufacturing Technology 9-10/2004 Go to the issue

Premium Partners