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2017 | OriginalPaper | Chapter

11. Characterization and Specification

Author : Marcel Pelgrom

Published in: Analog-to-Digital Conversion

Publisher: Springer International Publishing

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Abstract

The specification of the converter is a dominant mechanism to align the wishes of the user to the possibilities of the designer. Directly coupled to the specification is the measurement technique that serves to establish a numerical value for a theoretical concept. This chapter discusses the fundamentals of the characterization and measurement techniques, such as histogram testing.

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previous chapter Sigma-Delta Modulation
Footnotes
1
Your author is no MatLab wizard, this example comes without any guarantee.
 
2
Also called: “missing-tone power ratio.”
 
Literature
48.
IEEE (1994) IEEE Std 1057–1994 IEEE standard for digitizing waveform recorders
49.
IEEE (2000) IEEE 1241–2000, Standard for terminology and test methods for analog-to-digital converters. IEEE Std 1241. ISBN:0-7381-2724-8, revision 2007
50.
Tilden SJ, Linnenbrink TE, Green PJ (1999) Overview of IEEE-STD-1241 standard for terminology and test methods for analog-to-digital converters. In: Instrumentation and measurement technology conference, pp 1498–1503
199.
Scholtens PCS, Vertregt M (2002) A 6-b 1.6-Gsample/s flash ADC in 0.18μm CMOS using averaging termination. IEEE J Solid-State Circuits 37:1599–1609CrossRef
367.
Irons FH (2000) The noise power ratio – theory and adc testing. IEEE Trans Instrum Meas 49:659–665CrossRef
368.
Milor LS (1998) A tutorial introduction to research on analog and mixed-signal circuit testing. IEEE Trans Circuits Syst II 45:1389–1407CrossRef
Metadata
Title
Characterization and Specification
Author
Marcel Pelgrom
Copyright Year
2017
Book
Analog-to-Digital Conversion

Print ISBN: 978-3-319-44970-8

Electronic ISBN: 978-3-319-44971-5

Copyright Year: 2017

DOI
https://doi.org/10.1007/978-3-319-44971-5_11