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Journal of Materials Science
Published in: Journal of Materials Science 5/2007

01-03-2007 | Nano May 2006

Characterization of nanocrystalline materials by X-ray line profile analysis

Author: Tamás Ungár

Published in: Journal of Materials Science | Issue 5/2007

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Abstract

X-ray line profile analysis is shown to be a powerful tool to characterize the microstructure of nanocrystalline materials in terms of grain and subgrain size, dislocation structure and dislocation densities and planar defects, especially stacking faults and twin boundaries. It is shown that the X-ray method can provide valuable complementary information about the microstructure, especially when combined with transmission electron microscopy and differential scanning calorimetry.
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Metadata
Title
Characterization of nanocrystalline materials by X-ray line profile analysis
Author
Tamás Ungár
Publication date
01-03-2007
Published in
Journal of Materials Science / Issue 5/2007
Print ISSN: 0022-2461
Electronic ISSN: 1573-4803
DOI
https://doi.org/10.1007/s10853-006-0696-1

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