Skip to main content
Disciplines
Automotive Business IT + Informatics Construction + Real Estate Electrical Engineering + Electronics Energy + Sustainability Insurance + Risk Finance + Banking Management + Leadership Marketing + Sales Mechanical Engineering + Materials
Events
DE
EN
Books
Journals
Topic Page
Marketing
Start single access now
Access for companies
EXTENDED SEARCH
Log in
Top
Published in:
Introduction Read chapter Read first chapter

2011 | OriginalPaper | Chapter

6. Current Standardization Activities of Measurement and Characterization for Industrial Applications

Authors : Shingo Ichimura, Hidehiko Nonaka

Published in: Nanotechnology Standards

Publisher: Springer New York

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

This chapter briefly describes current standardization activities for measurement and characterization of nanotechnology in various standardization organizations, with emphasis on the activity of ISO (International Organization for Standardization). Since the establishment of the U.S. National Nanotechnology Initiative (NNI) in 2001, both industrial and developing countries have accelerated investment for research and development (R&D) of nanotechnology [1]. In accordance with the increase in attention to nanotechnology worldwide, the interest in standardization for nanotechnology became prominent in 2004 in a trilateral framework involving the U.S., Europe, and Asia.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

inform now
previous chapter Performance Standards
next chapter Implications of Measurement Standards for Characterizing and Minimizing Risk of Nanomaterials
Literature
 1.
Roco, M.: Nanotechnology R&D in the Americas and the global context. In: 2nd International Dialogue on Responsible Research and Development of Nanotechnology, Tokyo, Japan, 27–28 June 2006
 2.
 3.
Maynard, A.D.: Safe handling of nanotechnology, Nature 444, 267–269 (2006)CrossRef
 4.
 5.
Manna, S.K., Sarkar, S., Barr, J., Wise, K., Barrera, E.V., Jejelowo, O., Rice-Ficht, A.C., Ramesh, G.T.: Single-walled carbon nanotube induces oxidative stress and activates nuclear transcription factor-kB in human keratinocytes, Nano Letters 5, 1676–1684 (2005)CrossRef
 6.
Takagi, A., Hirose, A., Nishimura, T., Fukumori, N., Ogata, A., Ohashi, N., Kitajima, S., Kanno, J.: Induction of mesothelioma in p53+/- mouse by intraperitoneal application of multi-wall carbon nanotube, J. Toxicol. Sci. 33, 105–116 (2008)CrossRef
 7.
Poland, C.A., Duffin, R., Kinolch, I., Maynard, A., Wallace, W.A.H., Seaton, A., Brown, V.S., MacNee, W., Donaldson, K.: Carbon nanotubes introduced into the abdominal cavity of mice show asbestos-like pathogenicity in a pilot study, Nature Nanotechnology 3, 423–428 (2008)CrossRef
 8.
Hench, L.L.: In: Hench, L.L., Wilson, J. (eds.) An Introduction to Bioceramics, p. 319. World Scientific, Singapore (1993). Chapter 18: Characterization of Bioceramics
 9.
Hossain, K.: WG2 study group on strategy (2008), outline strategy for ISO TC 229 WG2 – nanotechnologies, ver. 8.0 (2008, unpublished)
10.
11.
Iijima, S.: Helical microtubules of graphitic carbon, Nature 354, 56–58 (1991)CrossRef
12.
Collins, P.G., Avouric, Ph.: Nanotubes for electronics, Sci, Am. 283, 62–69 (2000)CrossRef
13.
Terrones, M.: Science and technology of the twenty-first century: Synthesis, Properties, and Applications of Carbon Nanotubes, Ann. Rev. Mater. Res. 33, 419–501 (2003)CrossRef
14.
Osawa, E.: Kagaku (in Japanese) 25, 854–863 (1970)
15.
Kroto, H.W., Heath, J.R., O’Brien, S.C., Curl, R.F., Smalley, R.E.: C60 Buckminsterfullerene, Nature 318, 162–163 (1985)CrossRef
16.
Chai, Y., Guo, T., Jin, C., Haufler, R.E., Chibante, L.P.F., Fure, J., Wang, L., Alford, J.M., Smalley, E.: Fullerenes with metals inside, J. Phys. Chem. 95, 7564–7568 (1991)CrossRef
17.
Hinokuma, K., Ata, M.: Fullerene proton conductors, Chem. Phys. Lett. 341, 442–446 (2001)CrossRef
18.
Hinokuma, K., Ata, M.: Proton conduction in polyhydroxy hydrogensulfated fullerenes, J. Electrochem. Soc. 150, A112–A116 (2003)CrossRef
19.
Chikamatsu, M., Nagamatsu, S., Yoshida, Y., Saito, K., Yase, K., Kikuchi, K.: Solution-processed n-type organic thin-film transistors with high field-effect mobility, Appl. Phys. Lett. 87, 203504 (2005)CrossRef
20.
Ichimura, S.: Current activities of ISO TC229/WG2 on purity evaluation and quality assurance standards for carbon nanotubes, Anal. Bioanal. Chem 396, 963–971 (2010)CrossRef
21.
Ichimura, S., Itoh, H., Fujimoto, T.: Current standardization activities for the measurement and characterization of nanomaterials and structures, J. Phys. Conf. Ser. 159, 012001 (2009)CrossRef
22.
Itoh, H., Fujimo, T., Ichimura, S.: Tip characterizer for atomic force microscopy, Rev. Sci. Instrum. 77, 103704 (2006)CrossRef
23.
Homma, Y., Takenaka, H., Toujou, F., Takano, A., Hayashi, S., Shimizu, R.: Evaluation of the sputtering rate variation in SIMS ultra-shallow depth profiling using multiple short-period delta layers, Surf. Interface Anal. 35, 544–547 (2003)CrossRef
24.
25.
Tougaard, S.: Surface nanostructure determination by x-ray photoemission spectroscopy peak shape analysis, J. Vac. Sci. Technol. A14, 1415–1423 (1996)
26.
Hajati, S., Coultas, S., Blomfieldc, C., Tougaarda, S.: Nondestructive quantitative XPS imaging of depth distribution of atoms on the nanoscale, Surface Interface Anal. 40, 688–691 (2008)CrossRef
27.
Baer, D., Amonette, J.E., Engelhard, M.H., Gaspar, D.J., Karakoti, A.S., Kuchibhatla, S., Nachimuthu, P., Nurmi, J.T., Qiang, Y., Sarathy, V., Seal, S., Sharma, A., Tratnyeke, P.G., Wang, C.-M.: Characterization challenges for nanomaterials, Surf. Interface Anal. 40, 529–537 (2008)CrossRef
28.
Yacaman, M.J., Ascencio, J.A., Liu, H.B., Gardea-Torresdey, J.: Structure shape and stability of nanometric sized particles, J. Vac. Sci. Technol. B 19, 1091 (2001)CrossRef
29.
Smith, D.J., Petfordlong, A.K., Wallenberg, L.R., Bovin, J.O.: Dynamic atomic-level rearrangements in small gold particles, Science 233, 872 (1986)CrossRef
30.
Zhao, J.P., Chen, Z.Y., Cai, X.J., Rabalais, J.W.: Annealing effect on the surface plasmon resonance absorption of a Ti–SiO2 nanoparticle composite, J. Vac. Sci. Technol. B 24, 1104 (2006)CrossRef
31.
Wang, C.M., Baer, D.R., Amonette, J.E., Engelhard, M.E., Antony, J.J., Qiang, Y.: Electron beam-induced thickening of the protective oxide layer around Fe nanoparticles, Ultramicros-copy 108, 43 (2007)CrossRef
32.
Jurac, S., Johnson, R.E., Donn, B.: Monte Carlo calculations of the sputtering of grains: enhanced sputtering of small grains, Astrophys. J. 503, 247 (1998)CrossRef
33.
Gaspar, D.J., Laskin, A., Wang, W., Hunt, S.W., Finlayson-Pitts, B.J.: TOF-SIMS analysis of sea salt particles: imaging and depth profiling in the discovery of an unrecognized mechanism for pH buffering, Appl. Surf. Sci. 231–232, 520 (2004)CrossRef
34.
Chen, H.H., Urquidez, O.A., Ichimura, S., Rodriguez, L.H., Brenner, M.P., Aziz, M.J.: Shocks in ion sputtering sharpen steep surface features, Science 310, 294 (2005)CrossRef
35.
Gaspar, D.J., Engelhard, M.H., Henry, M.C., Baer, D.R.: Erosion rate variations during XPS sputter depth profiling of nanoporous films, Surf. Interface Anal. 37, 417 (2005)CrossRef
36.
Jung, Y.J., Homma, Y., Vajtai, R., Kobayashi, Y., Ogino, T., Ajayan, P.M.: Straightening suspended single walled carbon nanotubes by ion irradiation, Nano Lett. 4, 1109 (2004)CrossRef
37.
Baer, D.R., Engelhard, M.H., Gaspar, D.J., Matson, D.W., Pecher, K., Williams, J.R., Wang, C.M.: Challenges in applying surface analysis methods to nanoparticles and nanostructured materials, J. Surf. Anal. 12, 101 (2005)
38.
Zhang, H.Z., Gilbert, B., Huang, F., Banfield, J.F.: Water-driven structure transformation in nanoparticles at room temperature, Nature 424, 1025 (2003)CrossRef
39.
Chernyshova, I.V., Hochella, M.F., Madden, A.S.: Size-dependent structural transformations of hematite nanoparticles. 1. Phase transition, Phys. Chem. Chem. Phys. 9, 1736 (2007)CrossRef
40.
Chen, W., Pan, X.L., Willinger, M.G., Su, D.S., Bao, X.H.: Facile Autoreduction of Iron Oxide/Carbon Nanotube Encapsulates, J. Am. Chem. Soc.128,3136(2006)CrossRef
41.
Gliemann, H., Almeida, A.T., Petri, D.F.S., Schimmel, T.: Nanostructure formation in polymer thin films influenced by humidity, Surf. Interface Anal. 39, 1 (2007)CrossRef
42.
Scher, E.C., Manna, L., Alivisatos, A.P.: Shape control and applications of nanocrystals, Philos. Trans. R. Soc. Lond. A 361, 241 (2003)CrossRef
43.
Frankamp, B.L., Boal, A.K., Tuominen, M.T., Rotello, V.M.: Direct control of the magnetic interaction between iron oxide nanoparticles through dendrimer-mediated self-assembly, J. Am. Chem. Soc. 127, 9731 (2005)CrossRef
44.
Karakoti, A.S., Kuchibhatla, S., Babu, K.S., Seal, S.: Direct synthesis of nanoceria in aqueous polyhydroxyl solutions, J. Phys. Chem. C 111, 17232–17240 (2007)CrossRef
45.
Kuchibhatla, S., Karakoti, A.S., Seal, S.: Hierarchical assembly of inorganic nanostructure building blocks to octahedral superstructures – a true template-free self-assembly, Nanotechnology 18, (2007)CrossRef
46.
Wertheim, G.K., Dicenzo, S.B.: Cluster growth and core-electron binding energies in supported metal clusters, Phys. Rev. B 37, 844 (1988)CrossRef
47.
Dane, A., Demirok, U.K., Aydinli, A., Suzer, S.: X-ray photoelectron spectroscopic analysis of Si nanoclusters in SiO2 matrix, J. Phys. Chem. B 110, 1137 (2006)CrossRef
48.
Norman, T.J., Grant, C.D., Magana, D., Zhang, J.Z., Liu, J., Cao, D.L., Bridges, F., Van Buuren, A.: Near infrared optical absorption of gold nanoparticle aggregates, J. Phys. Chem. B 106, 7005 (2002)CrossRef
49.
Reinhard, B.M., Siu, M., Agarwal, H., Alivisatos, A.P., Liphardt, J.: Calibration of dynamic molecular rulers based on plasmon coupling between gold nanoparticles, Nano Lett. 5, 2246 (2005)CrossRef
50.
Bayer, M., Hawrylak, P., Hinzer, K., Fafard, S., Korkusinski, M., Wasilewski, Z.R., Stern, O., Forchel, A.: Coupling and entangling of quantum states in quantum dot molecules, Science 291, 451 (2001)CrossRef
51.
Schwartz, D.A., Norberg, N.S., Nguyen, Q.P., Parker, J.M., Gamelin, D.R.: Magnetic quantum dots: Synthesis, spectroscopy, and magnetism of Co2+- and Ni2+-Doped ZnO nanocrystals, J. Am. Chem. Soc. 125, 13205 (2003)CrossRef
52.
Liu, H., Brison, L.C.: A hybrid numerical-analytical method for modeling the viscoelastic properties of polymer nanocomposites, J. Appl. Mech. 73, 758 (2006)CrossRef
53.
Glover, M., Meldrum, A.: Effect of “buffer layers” on the optical properties of silicon nanocrystal superlattices, Opt. Mater. 27, 977 (2005)CrossRef
54.
55.
Fujimoto, T., CIRJE-F-182 (Center for Intrnational Research on the Japanese Economy, Faculty of Economics, The Univ. of Tokyo): Architecture, capability, and competitiveness of firms and industries (2002)
Metadata
Title
Current Standardization Activities of Measurement and Characterization for Industrial Applications
Authors
Shingo Ichimura
Hidehiko Nonaka
Copyright Year
2011
Publisher
Springer New York
Book
Nanotechnology Standards

Print ISBN: 978-1-4419-7852-3

Electronic ISBN: 978-1-4419-7853-0

Copyright Year: 2011

DOI
https://doi.org/10.1007/978-1-4419-7853-0_6

Premium Partners

    Image Credits