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2013 | OriginalPaper | Chapter

Dependable Embedded Memory for Intelligent Systems

Authors : Yen-Chieh Huang, Tsung-Chu Huang

Published in: Intelligent Technologies and Engineering Systems

Publisher: Springer New York

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Abstract

Contiguity along Gray codes and neighborhood among cluster faults are naturally connected by a novel hypercube-based address remapping unit. A novel memory repair architecture based on redundant hypercube is proposed, which mainly consists of a modified ternary CAM with an address concentrator. A modified ESPRESSO tool is developed for redundancy analysis on clustered-fault repairing optimization. Based on the redundancy analysis for a two-dimensional Gray-code-ordered memory array, every clustered fault with a width of no more than w and a length of no more than l can be repaired by a single hypercube-based spare row with a degree of \( \left( {\lceil \log 2(w - 1)\rceil +1} \right)\;\left( {\lceil \log 2(l - 1)\rceil + 1} \right) \). Finally 100% of repair rate can be obtained using only a few equivalent rows.

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Metadata
Title
Dependable Embedded Memory for Intelligent Systems
Authors
Yen-Chieh Huang
Tsung-Chu Huang
Copyright Year
2013
Publisher
Springer New York
Book
Intelligent Technologies and Engineering Systems

Print ISBN: 978-1-4614-6746-5

Electronic ISBN: 978-1-4614-6747-2

Copyright Year: 2013

DOI
https://doi.org/10.1007/978-1-4614-6747-2_67