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Published in: Journal of Materials Science 1/2011

01-01-2011

Dielectric properties of organosilicons from first principles

Authors: C. C. Wang, R. Ramprasad

Published in: Journal of Materials Science | Issue 1/2011

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Abstract

Density functional perturbation theory calculations have been performed to determine the dielectric constant of Si “doped” polyethylene (PE). Substitution of C atoms in PE by Si ranging from 0 to 100% has been considered. Both the electronic and ionic contributions to the dielectric constant increase with increasing Si content. These increases are attributed, respectively, to enhanced σ conjugation and increased IR vibrational intensity of modes involving Si containing bonds (owing to their softness and polarity).

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Metadata
Title
Dielectric properties of organosilicons from first principles
Authors
C. C. Wang
R. Ramprasad
Publication date
01-01-2011
Publisher
Springer US
Published in
Journal of Materials Science / Issue 1/2011
Print ISSN: 0022-2461
Electronic ISSN: 1573-4803
DOI
https://doi.org/10.1007/s10853-010-4830-8

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