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ATZ worldwide
Published in: ATZ worldwide 12/2016

01-11-2016 | Development

Efficient HiL Test Process with Data and Test Management

Authors: Anne Geburzi, B. Sc., Jann-Eve Stavesand, B. Sc.

Published in: ATZ worldwide | Issue 12/2016

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Excerpt

Testing today’s automotive electronic control units (ECUs) is unimaginable without hardware-in-the-loop (HiL) simulation. For this type of simulation, process-related factors are gaining in importance, from planning the test activities, to using the test resources as efficiently as possible, to managing test artifacts. A central data and test management by dSpace is supporting the test process. …
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Metadata
Title
Efficient HiL Test Process with Data and Test Management
Authors
Anne Geburzi, B. Sc.
Jann-Eve Stavesand, B. Sc.
Publication date
01-11-2016
Publisher
Springer Fachmedien Wiesbaden
Published in
ATZ worldwide / Issue 12/2016
Electronic ISSN: 2192-9076
DOI
https://doi.org/10.1007/s38311-016-0133-2

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