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2019 | OriginalPaper | Chapter

5. Electronics and Control for Atomic Force Microscopy

Author : Bert Voigtländer

Published in: Atomic Force Microscopy

Publisher: Springer International Publishing

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Abstract

We introduce the time domain and the frequency domain approaches to electronic signals. Then we discuss some basic electronic components, such as voltage divider, low-pass filter, and operational amplifier. We continue to discuss topics more closely related to atomic force microscopy such as the feedback electronics, which in AFM serves to stabilize the tip-sample distance. We close this chapter on electronics by discussing how digital-to-analog converters and analog-to-digital converters work in principle.

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previous chapter Atomic Force Microscopy Designs

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\(V_{\mathrm {out}} = V_1 +V_2 = I (R_1 + R_2) = (V_1/R_1) (R_1 +R_2) = V_- \frac{R_1+R_2}{R_1}\).

F. Reif, Fundamentals of Statistical and Thermal Physics (Waveland Press Inc., Long Grove, 1965). ISBN: 1577666127

W.H. Press, S.A. Teukolsky, W.T. Vetterling, B.P. Flannery, Numerical Recipes: The Art of Scientific Computing, 3rd edn. (Cambridge University Press, Cambridge, 2007). ISBN: 9780521880688

J. Johnson, Thermal agitation of electricity in conductors. Phys. Rev. 32, 97 (1928). https://doi.org/10.1103/PhysRev.32.97ADSCrossRef

H. Nyquist, Thermal agitation of electric charge in conductors. Phys. Rev. 32, 110 (1928). https://doi.org/10.1103/PhysRev.32.110

R.G. Lyons, Understanding Digital Signal Processing, 3rd edn. (Pearson Education, London, 2011). ISBN: 8131764362

R.E. Best, Phase Locked Loops, 6th edn. (Mc Graw Hill, New York, 2007). ISBN: 0071493751

J. Hahn, T. Edison, T.F. Edgar, A note on stability analysis using Bode plots. Chem. Eng. Educ. 35, 208 (2001)

D.Y. Abramovitch, S. Hoen, R. Workman, in American Control Conference on Semi-automatic Tuning of PID Gains for Atomic Force Microscopes (2008), p. 2684. https://doi.org/10.1109/ACC.2008.4586898

Title: Electronics and Control for Atomic Force Microscopy
Author: Bert Voigtländer
Publisher: Springer International Publishing
Book: Atomic Force Microscopy
Print ISBN: 978-3-030-13653-6

Electronic ISBN: 978-3-030-13654-3

Copyright Year: 2019
DOI: https://doi.org/10.1007/978-3-030-13654-3_5