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2011 | OriginalPaper | Chapter

EMC Robust Design for Smart Power High Side Switches

Authors : Paolo Del Croce, Bernd Deutschmann

Published in: Analog Circuit Design

Publisher: Springer Netherlands

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Abstract

The continued increase of electric and electronic systems in modern cars leads to growing electromagnetic noise which increases the risk of interference to the functional integrity of the system. This places greater demands to predict integrated circuit (IC) electromagnetic immunity in the early design phase. This paper describes an approach to early define the immunity of smart power automotive high side switches by using Direct Power Injection (DPI) simulations. A methodology will be presented to transform IC robustness requirements from a DPI level into a supply noise level, as a result of pin to pin impedance design.

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previous chapter Radiation Effects and Hardening by Design in CMOS Technologies

next chapter Noise-Coupled Delta-Sigma ADCS

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Title: EMC Robust Design for Smart Power High Side Switches
Authors: Paolo Del Croce
Bernd Deutschmann
Publisher: Springer Netherlands
Book: Analog Circuit Design
Print ISBN: 978-94-007-0390-2

Electronic ISBN: 978-94-007-0391-9

Copyright Year: 2011
DOI: https://doi.org/10.1007/978-94-007-0391-9_6