Evolution of Intergranular Stresses in a Martensitic and an Austenitic NiTi Wire During Loading–Unloading Tensile Deformation

In situ synchrotron X-ray diffraction testing was carried out on a martensitic and an austenitic NiTi wire to study the evolution of internal stresses and the stress-induced martensite (SIM) phase transformation during room temperature tensile deformation. From the point of lattice strain evolution, it is concluded that (1) for the martensitic NiTi wire, detwinning of the [011]_B19′ type II twins and the {010}_B19′ compound twins is responsible for internal strains formed at the early stage of deformation. (2) The measured diffraction moduli of individual martensite families show large elastic anisotropy and strong influences of texture. (3) For the austenitic NiTi wire, internal residual stresses were produced due to transformation-induced plasticity, which is more likely to occur in austenite families that have higher elastic moduli than their associated martensite families. (4) Plastic deformation was observed in the SIM at higher stresses, which largely decreased the lower plateau stresses.