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Published in:
Acoustic Microscopy Read chapter Read first chapter

2018 | OriginalPaper | Chapter

30. Extended X-Ray Absorption Fine Structure

Author : Hitoshi Abe

Published in: Compendium of Surface and Interface Analysis

Publisher: Springer Singapore

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Abstract

Extended X-ray absorption fine structure (EXAFS) is a part of X-ray absorption spectroscopy methods to observe local structures of elements of interest.

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Literature
1.
Lee, P.A., Citrin, P.H., Eisenberger, P., Kincaid, B.M.: Rev. Mod. Phys. 53, 769 (1981)CrossRef
2.
Bunker, G.: Introduction to XAFS: a practical guide to X-ray absorption fine structure spectroscopy. Cambridge University Press, Cambridge (2010)CrossRef
3.
Zabinsky, S.I., Rehr, J.J., Ankudinov, A., Albers, R.C., Eller, M.J.: Phys. Rev. B 52, 2995 (1995)CrossRef
4.
Metadata
Title
Extended X-Ray Absorption Fine Structure
Author
Hitoshi Abe
Copyright Year
2018
Publisher
Springer Singapore
Book
Compendium of Surface and Interface Analysis

Print ISBN: 978-981-10-6155-4

Electronic ISBN: 978-981-10-6156-1

Copyright Year: 2018

DOI
https://doi.org/10.1007/978-981-10-6156-1_30

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