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2012 | OriginalPaper | Chapter
From Sizing over Design Centering and Pareto Optimization to Tolerance Pareto Optimization of Electronic Circuits
Author : Helmut Gräb
Published in: Scientific Computing in Electrical Engineering SCEE 2010
Publisher: Springer Berlin Heidelberg
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This paper presents an overview of sizing tasks in electronic circuit design and their corresponding formulations as optimization problems. We will start with the general multi-objective sizing problem. Then, the inclusion of statistically distributed parameters and of range-valued parameters into the scalar problems of yield optimization and design centering will be described. Finally, a problem formulation for considering these parameter tolerances by multi-objective Pareto optimization will be presented.