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11-04-2024 | Originalarbeit

Holistic Material Design for Reliability of Electronic Based Systems

Authors: Julien Magnien, Roland Brunner, Elke Kraker

Published in: BHM Berg- und Hüttenmännische Monatshefte

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Abstract

A holistic material design for reliability (DfR) concept in electronic systems is addressed. It is based on (1) electrical, thermal, and mechanical analysis to study and predict material properties when used as a part of an electronic system; (2) failure oriented accelerated testing (FOAT) to understand the physics-of-failures and quantify on a probabilistic basis the outcome of FOAT conducted on the most critical materials of the electronic system; and (3) physical and data driven predictive models (PM), both analytical and numerical, aimed at bridging the gap between process parameter, FOAT data, and field conditions. The holistic material DfR concept contributes to the key elements of reliability and robust design of electronic systems, namely performance, durability, quality, and lifetime.

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Metadata
Title
Holistic Material Design for Reliability of Electronic Based Systems
Authors
Julien Magnien
Roland Brunner
Elke Kraker
Publication date
11-04-2024
Publisher
Springer Vienna
Published in
BHM Berg- und Hüttenmännische Monatshefte
Print ISSN: 0005-8912
Electronic ISSN: 1613-7531
DOI
https://doi.org/10.1007/s00501-024-01457-5

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