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Measurement Techniques

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01-12-2014 | NANOMETROLOGY

Identification of Nanoparticles and the Measurement of their Concentration in Thin Films of Nanostructurized Polymers

Authors: A. V. Ushakov, M. N. Barshutina, S. N. Barshutin

Published in: Measurement Techniques | Issue 9/2014

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Abstract

A low-temperature tunneling resonance method by means of which the form and concentration of different types of nanoparticles 2–10 nm in size may be determined in thin polymer films is presented. An experimental evaluation of the precision, sensitivity, cost, and limitations of the method is performed. The practical value of the method when used in different branches of industry and under laboratory conditions is demonstrated.

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A. V. Platenkin, S. N. Barshutin, and V. P. Shelokhvostov, “A method of determining nanostructurized objects in disperse materials,” Vest. Tambov. Gos. Tekh. Univ., No. 36, 63–70 (2011).

S. N. Barshutin and S. V. Golovlev, “A study of thin modified films of nitrocellulose in alcoholic solutions of manganese oxide,” Molodoy Uchenyi, No. 10 (45), 33–38 (2012).

J. H. Davies, The Physics of Low-Dimensional Semiconductors: An Introduction, Univ. Press, Cambridge (UK) (1998).

Hyungmoo Yoo, Effect of Structural Parameters on Resonant Tunneling Diode Performance: Ph.D. Thesis, Corvallis (US) (1991).

Title: Identification of Nanoparticles and the Measurement of their Concentration in Thin Films of Nanostructurized Polymers
Authors: A. V. Ushakov
M. N. Barshutina
S. N. Barshutin
Publication date: 01-12-2014
Publisher: Springer US
Published in: Measurement Techniques / Issue 9/2014
Print ISSN: 0543-1972
Electronic ISSN: 1573-8906
DOI: https://doi.org/10.1007/s11018-014-0570-5

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