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Semiconductors
Published in: Semiconductors 3/2014

01-03-2014 | Surfaces, Interfaces, and Thin Films

Interface recombination velocity measurement in SiO2/Si

Authors: S. Ilahi, N. Yacoubi

Published in: Semiconductors | Issue 3/2014

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Metadata
Title
Interface recombination velocity measurement in SiO2/Si
Authors
S. Ilahi
N. Yacoubi
Publication date
01-03-2014
Publisher
Pleiades Publishing
Published in
Semiconductors / Issue 3/2014
Print ISSN: 1063-7826
Electronic ISSN: 1090-6479
DOI
https://doi.org/10.1134/S1063782614030130

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