2005 | OriginalPaper | Chapter
Lightweight Defect Localization for Java
Authors : Valentin Dallmeier, Christian Lindig, Andreas Zeller
Published in: ECOOP 2005 - Object-Oriented Programming
Publisher: Springer Berlin Heidelberg
Activate our intelligent search to find suitable subject content or patents.
Select sections of text to find matching patents with Artificial Intelligence. powered by
Select sections of text to find additional relevant content using AI-assisted search. powered by
A common method to localize defects is to compare the
coverage
of passing and failing program runs: A method executed only in failing runs, for instance, is likely to point to the defect. However, some failures, occur only after a specific
sequence
of method calls, such as multiple deallocations of the same resource. Such sequences can be collected from arbitrary Java programs at low cost; comparing object-specific sequences predicts defects better than simply comparing coverage. In a controlled experiment, our technique pinpointed the defective class in 39% of all test runs.