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ARC DISCHARGE AND LASER ABLATION SYNTHESIS OF SINGLEWALLED CARBON NANOTUBES Read chapter Read first chapter

2006 | OriginalPaper | Chapter

LOCAL RESISTANCE OF SINGLE-WALLED CARBON NANOTUBES AS MEASURED BY SCANNING PROBE TECHNIQUES

Authors : BRETT GOLDSMITH, PHILIP G. COLLINS

Published in: Carbon Nanotubes

Publisher: Springer Netherlands

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Single-walled carbon nanotube (SWCNT) resistance arising from point defects can be directly imaged using scanning probe techniques. Here, we combine Scanning Gate Microscopy (SGM) and Kelvin Force Microscopy (KFM) to electronically identify defect sites and study their contributions to SWCNT resistances.

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previous chapter HYDRODYNAMIC MODELING OF FAST ION INTERACTIONS WITH CARBON NANOTUBES
next chapter BAND STRUCTURE OF CARBON NANOTUBES EMBEDDED IN A CRYSTAL MATRIX
Metadata
Title
LOCAL RESISTANCE OF SINGLE-WALLED CARBON NANOTUBES AS MEASURED BY SCANNING PROBE TECHNIQUES
Authors
BRETT GOLDSMITH
PHILIP G. COLLINS
Copyright Year
2006
Publisher
Springer Netherlands
Book
Carbon Nanotubes

Print ISBN: 978-1-4020-4572-1

Electronic ISBN: 978-1-4020-4574-5

Copyright Year: 2006

DOI
https://doi.org/10.1007/1-4020-4574-3_27

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