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Published in: Journal of Electroceramics 1-4/2008

01-12-2008

Mechanism of capacitance aging under DC-bias field in X7R-MLCCs

Authors: Takaaki Tsurumi, Motohiro Shono, Hirofumi Kakemoto, Satoshi Wada, Kenji Saito, Hirokazu Chazono

Published in: Journal of Electroceramics | Issue 1-4/2008

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Abstract

Capacitance aging under DC electric fields has been studied on multilayer ceramic capacitors (MLCCs) with the X7R characteristics. The capacitance change with time was divided into two stages, the first- and the second-stage. The first-stage was due to the nonlinear permittivity of dielectrics and it should not be involved in the aging phenomenon. The second-stage depended on the MnO content, grain size and firing condition of dielectrics. From the behavior of the second-stage, it was concluded that the capacitance aging was caused by the 90-degree domain switching in BaTiO3 in the core. The first-stage was due to the nonlinear permittivity but the domain switching was also included in the first-stage if the domain walls moved by the first application of DC field. The change in the aging behavior with the intensity of DC field could be explained by separating capacitance change into the nonlinear permittivity and the domain switching according to the mechanism proposed in this study.

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Metadata
Title
Mechanism of capacitance aging under DC-bias field in X7R-MLCCs
Authors
Takaaki Tsurumi
Motohiro Shono
Hirofumi Kakemoto
Satoshi Wada
Kenji Saito
Hirokazu Chazono
Publication date
01-12-2008
Publisher
Springer US
Published in
Journal of Electroceramics / Issue 1-4/2008
Print ISSN: 1385-3449
Electronic ISSN: 1573-8663
DOI
https://doi.org/10.1007/s10832-007-9071-0

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