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Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy Read chapter Read first chapter

2011 | OriginalPaper | Chapter

5. Multi-Frequency Atomic Force Microscopy

Author : Roger Proksch

Published in: Scanning Probe Microscopy of Functional Materials

Publisher: Springer New York

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Abstract

The atomic force microscope (AFM) was invented in 1986 [1], a close relative of another instrument, the scanning tunneling microscope (STM), invented in 1981 [2]. Both fall under the umbrella of techniques and instruments referred to as scanning probe microscopes (SPMs), with the common thread being that a sharp probe is scanned in a regular pattern to map some sample characteristic. Unlike the STM, the AFM can readily image insulating surfaces. Combined with the ability to study a wide variety of samples and sample environments – ambient, liquid, and vacuum – has made AFM the technique of choice for many high resolution surface imaging applications, including imaging with atomic resolution. Since those early days, AFM techniques have become the mainstay of nanoscience and nanotechnology by providing the capability for structural imaging and manipulation on the nanometer and atomic scales. Beyond simple topographic imaging, AFMs have found an extremely broad range of applications for probing electrical, magnetic, and mechanical properties – often at the level of several tens of nanometers.

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previous chapter Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods
next chapter Dynamic Nanomechanical Characterization Using Multiple-Frequency Method
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Metadata
Title
Multi-Frequency Atomic Force Microscopy
Author
Roger Proksch
Copyright Year
2011
Publisher
Springer New York
Book
Scanning Probe Microscopy of Functional Materials

Print ISBN: 978-1-4419-6567-7

Electronic ISBN: 978-1-4419-7167-8

Copyright Year: 2011

DOI
https://doi.org/10.1007/978-1-4419-7167-8_5

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