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2019 | OriginalPaper | Chapter

17. Noise in Atomic Force Microscopy

Author : Bert Voigtländer

Published in: Atomic Force Microscopy

Publisher: Springer International Publishing

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Abstract

In topographic images, the noise in the vertical position of the tip (i.e. the noise in the tip-sample distance) should be considerably smaller than the topography signal on the sample to be measured. If atomic steps are imaged, the noise should have an amplitude much smaller than 1 Å. In the following we do not consider noise due to floor vibrations or sound, but more fundamental limits of noise due to thermal excitation of the cantilever, or due to the detection limit of the preamplifier detecting the signal.

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previous chapter Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy—Non-contact Atomic Force Microscopy

next chapter Quartz Sensors in Atomic Force Microscopy

We do not indicate explicitly that the carrier frequency is the shifted resonance frequency \(f'_0\).

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F.J. Giessibl, F. Pielmeier, T. Eguchi, T. An, Y. Hasegawa, Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Phys. Rev. B 84, 125409 (2011). https://doi.org/10.1103/PhysRevB.84.125409CrossRefADS

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J. Welker, F. de Faria Elsner, F.J. Giessibl, Application of the equipartition theorem to the thermal excitation of quartz tuning forks. Appl. Phys. Lett. 99, 084102 (2011), https://doi.org/10.1063/1.3627184

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S. Morita, F.J. Giessibl, R. Wiesendanger, (eds.), Non-Contact Atomic Force Microscopy, vol. 2 (Springer, Heidelberg, 2009), https://doi.org/10.1007/978-3-642-01495-6

Title: Noise in Atomic Force Microscopy
Author: Bert Voigtländer
Publisher: Springer International Publishing
Book: Atomic Force Microscopy
Print ISBN: 978-3-030-13653-6

Electronic ISBN: 978-3-030-13654-3

Copyright Year: 2019
DOI: https://doi.org/10.1007/978-3-030-13654-3_17