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Machine Intelligence Research

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01-02-2013

Robust Filtration Techniques in Geometrical Metrology and Their Comparison

Authors: Shan Lou, Wen-Han Zeng, Xiang-Qian Jiang, Paul J. Scott

Published in: Machine Intelligence Research | Issue 1/2013

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Abstract

Filtration is one of the core elements of analysis tools in geometrical metrology. Filtration techniques are progressing along with the advancement of manufacturing technology. Modern filtration techniques are required to be robust against outliers, applicable to surfaces with complex geometry and reliable in whole range of measurement data. A comparison study is conducted to evaluate commonly used robust filtration techniques in the field of geometrical metrology, including the two-stage Gaussian filter, the robust Gaussian regression filter, the robust spline filter and morphological filters. They are compared in terms of four aspects: functionality, mathematical computation, capability and characterization parameters. As a result, this study offers metrologists a guideline to choose the appropriate filter for various applications.

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[1]

X. Jiang, P. J. Scott, D. J. Whitehouse, L. Blunt. Paradigm shifts in surface metrology, Part I. Historical philosophy. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, vol. 463, no. 2085, pp. 2049–2070, 2007.CrossRef

[2]

D. J. Whitehouse. Handbook of Surface Metrology, Philadelphia, PA, USA: Taylor & Francis, 1994.

[3]

Geometrical Product Specifications (GPS) - Filtration, ISO 16610 Series, 2010.

[4]

R. E. Reason. Report on reference lines for roughness and roundness. CIRP Annals - Manufacturing Technology, vol. 2, pp. 95–104, 1961.

[5]

D. J. Whitehouse, R. E. Reason. The Equation of the Mean Line of Surface Texture Found by an Electric Wave Filter, London, UK: Rank Organisation, 1963.

[6]

D. J. Whitehouse. An improved type of wave filter for use in surface-finish measurement. Proceedings Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture, vol. 192, pp. 306–318, 1967.

[7]

Surface Texture: Profile Method - Metrological Characteristics of Phase Correct Filters, ISO 11562, 1996.

[8]

H. Von Weingraber. Uber die Eignung des Hu¨llprofils als Bezugslinie fu¨r die Messung der Rauheit. CIRP Annals, vol. 5, pp. 116–28, 1956.

[9]

J. Haesing. Bestimmung der Glaettungstiefe rauher Flaechen. PTB-Mittelungen, vol. 4, pp. 339–340, 1964.

[10]

J. Peters, J. B. Bryan, W. T. Eslter, C. Evans, H. Kun-zmann, D. A. Lucca, S. Sartori, H. Sato, E. G. Thwaite, P. Vanherck, R. J. Hocken, J. Peklenik, T. Pfeifer, H. Trumpold, T. V. Vorburger. Contribution of CIRP to the development of metrology and surface quality evaluation during the last fifty years. CIRP Annals - Manufacturing Technology, vol. 50, no. 2, pp. 471–488, 2001.CrossRef

[11]

V. Radhakrishnan, A. Weckenmann. A close look at the rough terrain of surface finish assessment. Proceedings Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture, vol. 212, no. 5, pp. 411–420, 1998.CrossRef

[12]

X. Jiang, P. J. Scott, D. J. Whitehouse, L. Blunt. Paradigm shifts in surface metrology. Part II. The current shift. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, vol. 463, no. 2085, pp. 2071–2099, 2007.CrossRef

[13]

X. Jiang, D. J. Whitehouse. Technology shift in surface metrology. CIRP Annals - Manufacturing Technology, vol. 61, no. 2, pp. 815–836, 2012.CrossRef

[14]

J. Seewig. Linear and robust Gaussian regression filters. Journal of Physics: Conference Series, vol. 13, pp. 254–257, 2006.

[15]

S. Brinkmann, H. Bodschwinna, H. W. Lemke. Accessing roughness in three-dimensions using Gaussian regression filtering. International Journal of Machine Tools and Manufacture, vol. 41, no. 13-14, pp. 2153–2161, 2001.CrossRef

[16]

W. Zeng, X. Jiang, P. J. Scott. Fast algorithm of the Robust Gaussian regression filter for areal surface analysis. Measurement Science and Technology, vol. 21, no. 5, pp. 055108, 2010.CrossRef

[17]

M. Krystek. Form filtering by splines. Measurement, vol. 18, no.1, pp. 9–15, 1996.CrossRef

[18]

M. Krystek. Transfer function of discrete spline filters. Advanced Mathematical Tools in Metrology III, P. Ciarlini, M. G. Cox, F. Pavese, D. Richter, Eds., Singapore, NJ: World Scientific, pp. 203–210, 1997.

[19]

W. Zeng, X. Jiang, P. Scott. A generalised linear and nonlinear spline filter. Wear, vol. 272, no. 3-4, pp. 544–547, 2011.CrossRef

[20]

V. Srinivasan. Discrete morphological filters for metrology. In Proceedings of the 6th ISMQC Symposium on Metrology for Quality Control in Production, TU Wien, Austria, pp. 623–628, 1998.

[21]

P. J. Scott. Scale-space techniques. In Proceedings of the 10th International Colloquium on Surfaces, Chemnitz, Germany: Chemintz University of Technology, pp. 153–161, 2000.

[22]

Surface Texture: Profile Method - Surface Having Stratified Functional Properties, ISO 13565, 1998.

[23]

X. Jiang. Robust solution for the evaluation of stratified functional surfaces. CIRP Annals - Manufacturing Technology, vol. 59, no 1, pp. 573–576, 2010.CrossRef

[24]

T. Goto, J. Miyakura, K. Umeda, S. Kadowaki, K. Yanagi. A robust spline filter on the basis of L2-norm. Precision Engineering, vol. 29, no.2, pp. 157–161, 2005.CrossRef

[25]

S. Lou, X. Q. Jiang, P. J. Scott. Morphological filters based on motif combination for functional surface evaluation. In Proceedings of the 17th International Conference on Automation & Computing, IEEE, Huddersfield, UK, pp. 133–137, 2011.

[26]

X. Jiang, S. Lou, P. J. Scott. Morphological method for surface metrology and dimensional metrology based on the alpha shape. Measurement Science and Technology, vol. 23, no.1, pp. 015003, 2012.CrossRef

[27]

S. Lou, X. Q. Jiang, P. J. Scott. Algorithms for morphological profile filters and their comparison. Precision Engineering, vol. 36, no. 3, pp. 414–423, 2012.CrossRef

[28]

C. M. Malburg. Surface profile analysis for conformable interfaces. Journal of Manufacturing Science and Engineering, vol. 125, no. 3, pp. 624–627, 2003.CrossRef

[29]

M. S. Shunmugam, V. Radhakrishnan. Two- and three-dimensional analyses of surfaces according to the E-system. Proceedings Institution of Mechanical Engineers, vol. 188, no.1, pp. 691–699, 1974.CrossRef

[30]

W. Zeng, X. Jiang, P. J. Scott. Roundness filtration by using a robust regression filter for areal surface analysis. Measurement Science and Technology, vol. 22, no. 3, pp. 035108, 2011.CrossRef

[31]

Geometrical Product Specification (GPS) - Surface Texture: Areal - Part 2: Terms, Definitions and Surface Texture Parameters, ISO 25178-2, 2007.

Title: Robust Filtration Techniques in Geometrical Metrology and Their Comparison
Authors: Shan Lou
Wen-Han Zeng
Xiang-Qian Jiang
Paul J. Scott
Publication date: 01-02-2013
Publisher: Springer-Verlag
Published in: Machine Intelligence Research / Issue 1/2013
Print ISSN: 2731-538X
Electronic ISSN: 2731-5398
DOI: https://doi.org/10.1007/s11633-013-0690-4

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