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Published in: Journal of Cryptographic Engineering 4/2018

15-11-2017 | Regular Paper

Scan-based side channel attack on stream ciphers and its prevention

Authors: Sandip Karmakar, Dipanwita Roy Chowdhury

Published in: Journal of Cryptographic Engineering | Issue 4/2018

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Abstract

Scan chains, a design for testability feature, are included in most modern-day ICs. But, it opens a side channel for attacking cryptographic chips. We propose a methodology by which we can recover internal states of any stream cipher using scan chains. We consider conventional scan chain design which is normally not scrambled or protected in any other way. In this scenario, the challenge of the adversary is to obtain the correspondence of output of the scan chain and the internal state registers of the stream cipher. We present a mathematical model of the attack and the correspondence between the scan chain-outputs and the internal state bits have been proved under this model. We propose an algorithm that through offline and online simulation forms bijection between the above-mentioned sets and thus finds the required correspondence. We also give an estimate of the number of offline simulations necessary for finding the correspondence. The proposed strategy is successfully applied to eStream hardware based winners MICKEY-128 2.0, Trivium and Grain-128.

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Literature
1.
go back to reference Agrawal, M., Karmakar, S., Saha, D., Mukhopadhayay, D.: Scan based side channel attacks on stream ciphers and their counter-measures. Prog. Cryptol. INDOCRYPT 2008 5368/2008, 226–238 (2008) Agrawal, M., Karmakar, S., Saha, D., Mukhopadhayay, D.: Scan based side channel attacks on stream ciphers and their counter-measures. Prog. Cryptol. INDOCRYPT 2008 5368/2008, 226–238 (2008)
2.
go back to reference Arslan, B., Orailoglu, A.: Circularscan: A scan architecture for test cost reduction. In: DATE 2002 (2004) Arslan, B., Orailoglu, A.: Circularscan: A scan architecture for test cost reduction. In: DATE 2002 (2004)
4.
go back to reference Babbage, S., Dodd, M.: The stream cipher MICKEY 2.0. eSTREAM, ECRYPT stream cipher project, vol. 2006 (2006) Babbage, S., Dodd, M.: The stream cipher MICKEY 2.0. eSTREAM, ECRYPT stream cipher project, vol. 2006 (2006)
5.
go back to reference Berzati, A., Canovas, C., Castagnos, G., Debraize, B., Goubin, L., Gouget, A., Paillier, P., Salgado, S.: Fault analysis of GRAIN-128. In: IEEE International Workshop on Hardware-Oriented Security and Trust, vol. 0, pp. 7–14 (2009) Berzati, A., Canovas, C., Castagnos, G., Debraize, B., Goubin, L., Gouget, A., Paillier, P., Salgado, S.: Fault analysis of GRAIN-128. In: IEEE International Workshop on Hardware-Oriented Security and Trust, vol. 0, pp. 7–14 (2009)
6.
go back to reference Canniere, C.D., Preneel, B.: TRIVIUM specifications. eSTREAM, ECRYPT stream cipher project (2006) Canniere, C.D., Preneel, B.: TRIVIUM specifications. eSTREAM, ECRYPT stream cipher project (2006)
7.
go back to reference Chaudhuri, P.P., Chowdhury, D.R., Nandi, S., Chattopadhyay, S.: A Brief Survey. Additive Cellular Automata—Theory and Applications. IEEE, Los Alamitos (1997) Chaudhuri, P.P., Chowdhury, D.R., Nandi, S., Chattopadhyay, S.: A Brief Survey. Additive Cellular Automata—Theory and Applications. IEEE, Los Alamitos (1997)
8.
go back to reference Hell, M., Johansson, T., Meier, W.: A stream cipher proposal: Grain-128. eSTREAM, ECRYPT stream cipher project, vol. 2006 (2006) Hell, M., Johansson, T., Meier, W.: A stream cipher proposal: Grain-128. eSTREAM, ECRYPT stream cipher project, vol. 2006 (2006)
9.
go back to reference Hely, D., Bancel, F., Flottes, M.L., Rouzeyre, B.: Test control for secure scan designs. In: Proceedings of the 10th IEEE European Symposium on Test, ETS 2005, pp. 190–195. Washington (2005) Hely, D., Bancel, F., Flottes, M.L., Rouzeyre, B.: Test control for secure scan designs. In: Proceedings of the 10th IEEE European Symposium on Test, ETS 2005, pp. 190–195. Washington (2005)
10.
go back to reference Hely, D., Bancel, F., Flottes, M.L., Rouzeyre, B.: A secure scan design methodology. In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, pp. 1177–1178. 3001 Leuven (2006) Hely, D., Bancel, F., Flottes, M.L., Rouzeyre, B.: A secure scan design methodology. In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, pp. 1177–1178. 3001 Leuven (2006)
11.
go back to reference Hely, D., Bancel, F., Flottes, M.L., Rouzeyre, B.: Secure scan techniques: a comparison. In: Proceedings of the 12th IEEE International Symposium on On-Line Testing, IOLTS 2006, pp. 119–124. Washington (2006) Hely, D., Bancel, F., Flottes, M.L., Rouzeyre, B.: Secure scan techniques: a comparison. In: Proceedings of the 12th IEEE International Symposium on On-Line Testing, IOLTS 2006, pp. 119–124. Washington (2006)
12.
go back to reference Hely, D., Flottes, M.L., Bancel, F., Rouzeyre, B., Berard, N., Renovell, M.: Scan design and secure chip. In: Proceedings of the 10th IEEE International On-Line Testing Symposium, IOLTS 2004, p. 219. Washington (2004) Hely, D., Flottes, M.L., Bancel, F., Rouzeyre, B., Berard, N., Renovell, M.: Scan design and secure chip. In: Proceedings of the 10th IEEE International On-Line Testing Symposium, IOLTS 2004, p. 219. Washington (2004)
13.
go back to reference Karmakar, S., Mukhopadhyay, D., Chowdhury, D.R.: d-monomial tests on cellular automata for cryptographic design. In: ACRI 2010 (2010) Karmakar, S., Mukhopadhyay, D., Chowdhury, D.R.: d-monomial tests on cellular automata for cryptographic design. In: ACRI 2010 (2010)
14.
go back to reference Karmakar, S., Mukhopadhyay, D., Chowdhury, D.R.: CAVium-strengthening Trivium using cellular automata. J. Cell. Autom. 7, 179 (2011)MathSciNetMATH Karmakar, S., Mukhopadhyay, D., Chowdhury, D.R.: CAVium-strengthening Trivium using cellular automata. J. Cell. Autom. 7, 179 (2011)MathSciNetMATH
15.
go back to reference Lee, J., Tehranipoor, M., Patel, C., Plusquellic, J.: Securing scan design using lock and key technique. In: Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2005, pp. 51–62. Washington (2005) Lee, J., Tehranipoor, M., Patel, C., Plusquellic, J.: Securing scan design using lock and key technique. In: Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2005, pp. 51–62. Washington (2005)
17.
go back to reference Mukhopadhyay, D., Banerjee, S., Chowdhury, D.R., Bhattacharya, B.B.: Cryptoscan: a secured scan chain architecture. In: Proceedings of the 14th Asian Test Symposium on Asian Test Symposium, ATS 2005, pp. 348–353. Washington (2005) Mukhopadhyay, D., Banerjee, S., Chowdhury, D.R., Bhattacharya, B.B.: Cryptoscan: a secured scan chain architecture. In: Proceedings of the 14th Asian Test Symposium on Asian Test Symposium, ATS 2005, pp. 348–353. Washington (2005)
18.
go back to reference Paterson, K.G., Blackburn, S.R., Murphy, S.: Comments to theory and applications of cellular automata in cryptography. IEEE Trans. Comput. 46(5), 637 (1997)MathSciNetCrossRef Paterson, K.G., Blackburn, S.R., Murphy, S.: Comments to theory and applications of cellular automata in cryptography. IEEE Trans. Comput. 46(5), 637 (1997)MathSciNetCrossRef
21.
go back to reference Sengar, G., Mukhopadhyay, D., Chowdhury, D.R.: Secured flipped scan-chain model for crypto-architecture. IEEE Trans. CAD Integr. Circuits Syst. 26(11), 2080–2084 (2007)CrossRef Sengar, G., Mukhopadhyay, D., Chowdhury, D.R.: Secured flipped scan-chain model for crypto-architecture. IEEE Trans. CAD Integr. Circuits Syst. 26(11), 2080–2084 (2007)CrossRef
24.
go back to reference Yang, B., Wu, K., Karri, R.: Scan based side channel attack on dedicated hardware implementations of data encryption standard. In: Proceedings of the International Test Conference, ITC 2004, pp. 339–344. Washington (2004) Yang, B., Wu, K., Karri, R.: Scan based side channel attack on dedicated hardware implementations of data encryption standard. In: Proceedings of the International Test Conference, ITC 2004, pp. 339–344. Washington (2004)
25.
go back to reference Yang, B., Wu, K., Karri, R.: Secure scan: a design-for-test architecture for crypto chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10), 2287–2293 (2006)CrossRef Yang, B., Wu, K., Karri, R.: Secure scan: a design-for-test architecture for crypto chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10), 2287–2293 (2006)CrossRef
Metadata
Title
Scan-based side channel attack on stream ciphers and its prevention
Authors
Sandip Karmakar
Dipanwita Roy Chowdhury
Publication date
15-11-2017
Publisher
Springer Berlin Heidelberg
Published in
Journal of Cryptographic Engineering / Issue 4/2018
Print ISSN: 2190-8508
Electronic ISSN: 2190-8516
DOI
https://doi.org/10.1007/s13389-017-0178-1

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