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2018 | OriginalPaper | Chapter

96. Scanning Transmission X-Ray Microscopy

Author : Yasuo Takeichi

Published in: Compendium of Surface and Interface Analysis

Publisher: Springer Singapore

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Abstract

Scanning transmission X-ray microscopy (STXM) is a method to obtain a microscopic image of the raster-scanned sample by detecting the transmission intensity of the focused X-rays. As drawn in Fig. 96.1, a Fresnel zone plate (FZP) is often used to focus the soft X-rays from the synchrotron radiation sources (Attwood in Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications. Cambridge University Press, 1999 [1]). An order-sorting aperture (OSA) is used to omit the zeroth and higher order diffractions. The photon energy can be tuned around the absorption edge of a specific element. The spatial resolution, i.e. the focusing size of the X-rays in the soft X-ray STXM is typically 20–100 nm. It is in principle determined by the diffraction limit of the lithographically fabricated FZPs (Attwood in Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications. Cambridge University Press, 1999 [1]). The most important measurement mode in the STXM is an “image stack,” that is, a number of images at different photon energy points to obtain a dataset with space (XY) plus energy (E) dimensions. From the dataset, one can obtain a local spectrum to analyze the near-edge X-ray absorption fine structure (NEXAFS).

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Literature
1.
go back to reference Attwood, D.: Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications, Chap. 9. Cambridge University Press (1999) Attwood, D.: Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications, Chap. 9. Cambridge University Press (1999)
2.
go back to reference Hitchcock, A.P.: Soft X-ray spectromicroscopy and ptychography. J. Elec. Spectrosc. Relat. Phenom. 200, 49–63 (2015)CrossRef Hitchcock, A.P.: Soft X-ray spectromicroscopy and ptychography. J. Elec. Spectrosc. Relat. Phenom. 200, 49–63 (2015)CrossRef
3.
go back to reference Kilcoyne, A.L.D., Tyliszczak, T., Steele, W.F., Fakra, S., Hitchcock, P., Franck, K., Anderson, E., Harteneck, B., Rightor, E.G., Mitchell, G.E., Hitchcock, A.P., Yang, L., Warwick, T., Ade, H.: Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source. J. Synchrotron Rad. 10, 125–136 (2003)CrossRef Kilcoyne, A.L.D., Tyliszczak, T., Steele, W.F., Fakra, S., Hitchcock, P., Franck, K., Anderson, E., Harteneck, B., Rightor, E.G., Mitchell, G.E., Hitchcock, A.P., Yang, L., Warwick, T., Ade, H.: Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source. J. Synchrotron Rad. 10, 125–136 (2003)CrossRef
4.
go back to reference Takeichi, Y., Inami, N., Suga, H., Miyamoto, C., Ueno, T., Mase, K., Takahashi, Y., Ono, K.: Design and performance of a compact scanning transmission X-ray microscope at the Photon Factory. Rev. Sci. Instrum. 87, 013704 (2016)CrossRef Takeichi, Y., Inami, N., Suga, H., Miyamoto, C., Ueno, T., Mase, K., Takahashi, Y., Ono, K.: Design and performance of a compact scanning transmission X-ray microscope at the Photon Factory. Rev. Sci. Instrum. 87, 013704 (2016)CrossRef
5.
go back to reference Koprinarov, I., Hitchcock, A.P., Li, W.H., Heng, Y.M., Stöver, H.D.H.: Quantitative Compositional Mapping of Core-Shell PolymerMicrospheres by Soft X-ray Spectromicroscopy. Macromol. 34, 4424–4429 (2001)CrossRef Koprinarov, I., Hitchcock, A.P., Li, W.H., Heng, Y.M., Stöver, H.D.H.: Quantitative Compositional Mapping of Core-Shell PolymerMicrospheres by Soft X-ray Spectromicroscopy. Macromol. 34, 4424–4429 (2001)CrossRef
6.
go back to reference Lerotic, M., Mak, R., Wirick, S., Meirer, F., Jacobsen, C.: MANTiS: a program for the analysis of X-ray spectromicroscopy data. J. Synchrotron Rad. 21, 1206–1212 (2014)CrossRef Lerotic, M., Mak, R., Wirick, S., Meirer, F., Jacobsen, C.: MANTiS: a program for the analysis of X-ray spectromicroscopy data. J. Synchrotron Rad. 21, 1206–1212 (2014)CrossRef
7.
go back to reference Hitchcock, A.P., Morin, C., Zhang, X., Araki, T., Dynes, J., Stöver, H., Brash, J., Lawrence, J.R., Leppard, G.G.: Soft X-ray spectromicroscopy of biological and synthetic polymer systems. J. Elec. Spectrosc. Relat. Phenom. 144, 259–269 (2005)CrossRef Hitchcock, A.P., Morin, C., Zhang, X., Araki, T., Dynes, J., Stöver, H., Brash, J., Lawrence, J.R., Leppard, G.G.: Soft X-ray spectromicroscopy of biological and synthetic polymer systems. J. Elec. Spectrosc. Relat. Phenom. 144, 259–269 (2005)CrossRef
Metadata
Title
Scanning Transmission X-Ray Microscopy
Author
Yasuo Takeichi
Copyright Year
2018
Publisher
Springer Singapore
DOI
https://doi.org/10.1007/978-981-10-6156-1_96

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