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2018 | OriginalPaper | Chapter

Scene Parsing with Deep Features and Per-Exemplar Detectors

Authors : Xiaofei Cui, Hanbing Qu, Xi Chen, Ziliang Qi, Liang Dong

Published in: Proceedings of 2017 Chinese Intelligent Automation Conference

Publisher: Springer Singapore

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Abstract

Scene parsing is the task of labeling every pixel in an image with its semantic category. This paper presents an approach that combines the convolution neural network with per-exemplar detectors for scene parsing. We use a convolution neural network to learn the image global features. Compared to most standard feature extraction approaches, the convolution neural network features can describe images better. Our system has the following steps. First, we use the global features to find the retrieval set which is similar to query images from training dataset. Then, we use local features to compute the likelihood scores of superpixels in the query image, which combined the per-exemplar detectors and Support Vector Machine (SVM) for classification. Finally, our system integrates multiple cues into a Markov Random Field (MRF) framework. We evaluate our system on two challenging datasets. The experimental results show that our method can achieve good performance.

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Metadata
Title
Scene Parsing with Deep Features and Per-Exemplar Detectors
Authors
Xiaofei Cui
Hanbing Qu
Xi Chen
Ziliang Qi
Liang Dong
Copyright Year
2018
Publisher
Springer Singapore
DOI
https://doi.org/10.1007/978-981-10-6445-6_40