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Pattern Analysis and Applications
Published in: Pattern Analysis and Applications 3/2019

16-05-2018 | Theoretical Advances

SIFT-based iris recognition revisited: prerequisites, advantages and improvements

Authors: C. Rathgeb, J. Wagner, C. Busch

Published in: Pattern Analysis and Applications | Issue 3/2019

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Abstract

Scale-invariant feature transform (SIFT), which represents a general purpose image descriptor, has been extensively used in the field of biometric recognition. Focusing on iris biometrics, numerous SIFT-based schemes have been presented in past years, offering an alternative approach to traditional iris recognition, which are designed to extract discriminative binary feature vectors based on an analysis of pre-processed iris textures. However, the majority of proposed SIFT-based systems fails to maintain the recognition accuracy provided by generic schemes. Moreover, traditional systems outperform SIFT-based approaches with respect to other key system factors, i.e. authentication speed and storage requirement. In this work, we propose a SIFT-based iris recognition system, which circumvents the drawbacks of previous proposals. Prerequisites, derived from an analysis of the nature of iris biometric data, are utilized to construct an improved SIFT-based baseline iris recognition scheme, which operates on normalized enhanced iris textures obtained from near-infrared iris images. Subsequently, different binarization techniques are introduced and combined to obtain binary SIFT-based feature vectors from detected keypoints and their descriptors. On the CASIAv1, CASIAv4-Interval and BioSecure iris database, the proposed scheme maintains the performance of different traditional systems in terms of recognition accuracy as well as authentication speed. In addition, we show that SIFT-based features complement those extracted by traditional schemes, such that a multi-algorithm fusion at score level yields a significant gain in recognition accuracy.
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Metadata
Title
SIFT-based iris recognition revisited: prerequisites, advantages and improvements
Authors
C. Rathgeb
J. Wagner
C. Busch
Publication date
16-05-2018
Publisher
Springer London
Published in
Pattern Analysis and Applications / Issue 3/2019
Print ISSN: 1433-7541
Electronic ISSN: 1433-755X
DOI
https://doi.org/10.1007/s10044-018-0719-y

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