Single cerium zirconate buffer layer on biaxially textured metal substrates for high performance coated conductors

Textured cerium zirconate (Ce _x Zr_1−x O₂) films were deposited on biaxially textured Ni-5at.%W substrate by direct-current (dc) reactive magnetron sputtering for low cost production of high performance YBa₂Cu₃O_7−δ (YBCO) coated conductors. Film composition was controlled by modulating dc power applied to the Ce metal target. X-ray diffraction analysis shows that all the samples exhibit epitaxial growth, with c-axis perpendicular to the substrate surface. The YBCO film deposited directly on the Ce_0.32Zr_0.68O₂ layer for optimized lattice matching shows a transition temperature T _c and critical current density J _c (75.5 K, self field) of 90.4 K and 1.3 MA/cm². The in-field dependence of J _c is similar to the standard CeO₂/YSZ/CeO₂ buffered samples. These results demonstrate that a single Ce _x Zr_1−x O₂ buffer layer, instead of CeO₂/YSZ/CeO₂ multi-buffer layers for the fabrication of YBCO coated conductors, provides advantages such as simplified architecture and potentially reduced cost due to the reduced fabrication steps.