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Journal of Materials Science

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01-11-2008

Spectral and directional emittance of alumina at 823 K

Authors: George Teodorescu, Peter D. Jones

Published in: Journal of Materials Science | Issue 22/2008

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Abstract

Spectral–directional emittance measurements of aluminum oxide (99.5% pure), in air, were performed at 823 K using an apparatus comprised of a Fourier Transform Infrared (FTIR) spectrometer, a blackbody radiating cavity (hohlraum), and a sample holder which allows directional measurements. The data cover a wide spectral range between 2 and 25 μm, and a directional range from a surface normal to a 72° polar angle. The aluminum oxide sample used in the experiment had a nominal surface roughness of 1 μm determined by a profilometer. Directional emittance shows no departure from dielectric behavior.

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Title: Spectral and directional emittance of alumina at 823 K
Authors: George Teodorescu
Peter D. Jones
Publication date: 01-11-2008
Publisher: Springer US
Published in: Journal of Materials Science / Issue 22/2008
Print ISSN: 0022-2461
Electronic ISSN: 1573-4803
DOI: https://doi.org/10.1007/s10853-008-2945-y

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