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2018 | OriginalPaper | Chapter

Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem

Authors : Xiaosong Du, Praveen Gurrala, Leifur Leifsson, Jiming Song, William Meeker, Ronald Roberts, Slawomir Koziel, Yonatan Tesfahunegn

Published in: Computational Science – ICCS 2018

Publisher: Springer International Publishing

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Abstract

Probability of detection (POD) is used for reliability analysis in nondestructive testing (NDT) area. Traditionally, it is determined by experimental tests, while it can be enhanced by physics-based simulation models, which is called model-assisted probability of detection (MAPOD). However, accurate physics-based models are usually expensive in time. In this paper, we implement a type of stochastic polynomial chaos expansions (PCE), as alternative of actual physics-based model for the MAPOD calculation. State-of-the-art least-angle regression method and hyperbolic sparse technique are integrated within PCE construction. The proposed method is tested on a spherically-void-defect benchmark problem, developed by the World Federal Nondestructive Evaluation Center. The benchmark problem is added with two uncertainty parameters, where the PCE model usually requires about 100 sample points for the convergence on statistical moments, while direct Monte Carlo method needs more than 10000 samples, and Kriging based Monte Carlo method is oscillating. With about 100 sample points, PCE model can reduce root mean square error to be within 1% standard deviation of test points, while Kriging model cannot reach that level of accuracy even with 200 sample points.

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Metadata
Title
Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem
Authors
Xiaosong Du
Praveen Gurrala
Leifur Leifsson
Jiming Song
William Meeker
Ronald Roberts
Slawomir Koziel
Yonatan Tesfahunegn
Copyright Year
2018
DOI
https://doi.org/10.1007/978-3-319-93701-4_47

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