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2013 | OriginalPaper | Chapter

10. Stochastic Models for Environmental Stress Screening

Authors : Maxim Finkelstein, Ji Hwan Cha

Published in: Stochastic Modeling for Reliability

Publisher: Springer London

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Abstract

There are different ways of improving reliability characteristics of manufactured items. The most common methodology adopted in industry is burn-in, which is a method of ‘elimination’ of initial failures (infant mortality). As was mentioned previously, the ‘sufficient condition’ for employing the traditional burn-in is the initially decreasing failure rate. For example, when a population of items is heterogeneous, and therefore consists of subpopulations with ordered failure (hazard) rates, it obviously contains weaker (with larger failure rates) subpopulations. As the weakest populations are dying out first, the failure rate of this population is often initially decreasing and burn-in can be effectively applied.

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Literature
1.
go back to reference Finkelstein M (2008) Failure Rate Modelling for Reliability and Risk. Springer, London Finkelstein M (2008) Failure Rate Modelling for Reliability and Risk. Springer, London
2.
go back to reference Fiorentino E, Saari AE (1983) Planning of production reliability stress-screening programs. IEEE Trans Reliab 32:247–252CrossRef Fiorentino E, Saari AE (1983) Planning of production reliability stress-screening programs. IEEE Trans Reliab 32:247–252CrossRef
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go back to reference Landers TL, Malstrom RM, Schmitt N, Fant E (1994) Electronics Manufacturing Processes. Prentice Hall, New Jersey Landers TL, Malstrom RM, Schmitt N, Fant E (1994) Electronics Manufacturing Processes. Prentice Hall, New Jersey
4.
go back to reference Yan L, English JR (1997) Economic cost modeling of environmental-stress-screening and burn-in. IEEE Trans Reliab 46:275–282CrossRef Yan L, English JR (1997) Economic cost modeling of environmental-stress-screening and burn-in. IEEE Trans Reliab 46:275–282CrossRef
Metadata
Title
Stochastic Models for Environmental Stress Screening
Authors
Maxim Finkelstein
Ji Hwan Cha
Copyright Year
2013
Publisher
Springer London
DOI
https://doi.org/10.1007/978-1-4471-5028-2_10