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Published in:
2009 | OriginalPaper | Chapter
Structural Fault Modelling in Nano Devices
Authors : Manoj S. Gaur, Raghavendra Narasimhan, Vijay Laxmi, Ujjwal Kumar
Published in: Nano-Net
Publisher: Springer Berlin Heidelberg
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In this paper we present a model for structural failures in nano-devices. Fault being considered include stuck-at and bridge faults only. This model is an extension of probabilistic model based on Gibbs energy distribution and belief propagation as presented in NANOLAB [1]. Results have been carried out on a 8-bit full adder circuit. Simulation results indicate that probabilistic TMR model represents bridge and stuck-at-1 faults better while deterministic model is more suited for stuck-at-0 faults.