Skip to main content
Top
Published in: Metals and Materials International 1/2019

28-07-2018

Study on Aging Effect of Adhesion Strength Between Polyimide Film and Copper Layer

Authors: Seok-Bon Koo, Chang-Myeon Lee, Sang-Jun Kwon, Jun-Mi Jeon, Jin-young Hur, Hong-Kee Lee

Published in: Metals and Materials International | Issue 1/2019

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

This paper experimentally confirmed that the adhesion strength of the copper layer formed on the surface of the polyimide film by wet plating greatly changes with the aging time. The adhesion strength of the copper layer showed a rapid increase from 4 to 10 h after aging had begun and then converged to a value without a significant change. The adhesion enhancement between polyimide film and copper layer by aging is due to the interlocking effect caused by the volume expansion of copper oxide (CuO) formed in the polyimide, the increased mobility of copper particles enlarged by the decrease of impurities in the copper layer grain boundaries, and the consequent change of the crystal structure of the copper layer leading to the internal stress reduction. Such adhesion improvement can be confirmed by the progress of the cohesive failure indicating the breakdown of the polyimide film.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference G. Rabilloud, High Performance Polymers, Polyimides in Electronics (Editions Technip, Paris, 2000), pp. 89–164 G. Rabilloud, High Performance Polymers, Polyimides in Electronics (Editions Technip, Paris, 2000), pp. 89–164
2.
go back to reference M.K. Ghosh, K.L. Mittal, Polyimides, Fundamentals and Applications (Marcel Dekker, New York, 1996), pp. 759–814 M.K. Ghosh, K.L. Mittal, Polyimides, Fundamentals and Applications (Marcel Dekker, New York, 1996), pp. 759–814
4.
go back to reference Y.-S. Lin, H.-M. Liu, C.-L. Chen, Surf. Coat. Technol. 200, 3775–3785 (2006)CrossRef Y.-S. Lin, H.-M. Liu, C.-L. Chen, Surf. Coat. Technol. 200, 3775–3785 (2006)CrossRef
5.
go back to reference S.H. Kim, S.W. Na, N.-E. Lee, Y.W. Nam, Y.-H. Kim, Surf. Coat. Technol. 200, 2072–2079 (2005)CrossRef S.H. Kim, S.W. Na, N.-E. Lee, Y.W. Nam, Y.-H. Kim, Surf. Coat. Technol. 200, 2072–2079 (2005)CrossRef
6.
go back to reference A. Ebe, E. Takahashi, Y. Iwamoto, N. Kuratani, S. Nishiyama, O. Imai, K. Ogata, Y. Setsuhara, S. Miyake, Thin Solid Films 281–282, 356–359 (1996)CrossRef A. Ebe, E. Takahashi, Y. Iwamoto, N. Kuratani, S. Nishiyama, O. Imai, K. Ogata, Y. Setsuhara, S. Miyake, Thin Solid Films 281–282, 356–359 (1996)CrossRef
7.
go back to reference S. Ikeda, H. Yanagimoto, K. Akamatsu, H. Nawafune, Adv. Funct. Mater. 17, 889–897 (2007)CrossRef S. Ikeda, H. Yanagimoto, K. Akamatsu, H. Nawafune, Adv. Funct. Mater. 17, 889–897 (2007)CrossRef
8.
go back to reference H.K. Lee, S.H. Son, H.Y. Lee, S.B. Koo, J. Adhes. Sci. Technol. 22, 47–64 (2008)CrossRef H.K. Lee, S.H. Son, H.Y. Lee, S.B. Koo, J. Adhes. Sci. Technol. 22, 47–64 (2008)CrossRef
9.
go back to reference H.K. Yun, K. Cho, J.K. Kim, C.E. Park, S.M. Sim, S.Y. Oh, M. Park, Polymer 38, 827–834 (1997)CrossRef H.K. Yun, K. Cho, J.K. Kim, C.E. Park, S.M. Sim, S.Y. Oh, M. Park, Polymer 38, 827–834 (1997)CrossRef
11.
go back to reference Z. Wang, A. Furuya, K. Yasuda, H. Ikeda, T. Baba, M. Hagiwara, S. Toki, S. Shingubara, H. Kubota, T. Ohmi, J. Adhes. Sci. Technol. 16, 1027–1040 (2002)CrossRef Z. Wang, A. Furuya, K. Yasuda, H. Ikeda, T. Baba, M. Hagiwara, S. Toki, S. Shingubara, H. Kubota, T. Ohmi, J. Adhes. Sci. Technol. 16, 1027–1040 (2002)CrossRef
12.
13.
go back to reference H.W. Kim, J.H. Kim, D.J. Kim, N.-E. Lee, J. Electrochem. Soc. 156, D525–D530 (2009)CrossRef H.W. Kim, J.H. Kim, D.J. Kim, N.-E. Lee, J. Electrochem. Soc. 156, D525–D530 (2009)CrossRef
14.
go back to reference S.J. Cho, T. Nguyen, J.H. Boo, J. Nanosci. Nanotechnol. 11, 5328–5333 (2011)CrossRef S.J. Cho, T. Nguyen, J.H. Boo, J. Nanosci. Nanotechnol. 11, 5328–5333 (2011)CrossRef
15.
go back to reference J.H. Das, J.E. Morris, IEEE Trans. Compon. Packag. Manuf. Technol. Part B 17, 620–625 (1994)CrossRef J.H. Das, J.E. Morris, IEEE Trans. Compon. Packag. Manuf. Technol. Part B 17, 620–625 (1994)CrossRef
16.
go back to reference N. Miki, K. Tanaka, A. Takahara, T. Kajiyama, J. Vac. Sci. Technol. B 18, 313 (2000)CrossRef N. Miki, K. Tanaka, A. Takahara, T. Kajiyama, J. Vac. Sci. Technol. B 18, 313 (2000)CrossRef
17.
go back to reference S. Lagrange, S.H. Brongersma, M. Judelewicz, A. Saerens, I. Vervoort, E. Richard, R. Palmans, K. Maex, Microelectron. Eng. 50, 449–457 (2000)CrossRef S. Lagrange, S.H. Brongersma, M. Judelewicz, A. Saerens, I. Vervoort, E. Richard, R. Palmans, K. Maex, Microelectron. Eng. 50, 449–457 (2000)CrossRef
20.
go back to reference H.N. Lee, Y.S. Han, J.H. Lee, J.Y. Hur, H.K. Lee, Mater. Trans. 54, 1040–1044 (2013)CrossRef H.N. Lee, Y.S. Han, J.H. Lee, J.Y. Hur, H.K. Lee, Mater. Trans. 54, 1040–1044 (2013)CrossRef
21.
go back to reference J.Y. Park, Y.S. Junga, J. Chob, W.K. Cho, Appl. Surf. Sci. 252, 5877–5891 (2006)CrossRef J.Y. Park, Y.S. Junga, J. Chob, W.K. Cho, Appl. Surf. Sci. 252, 5877–5891 (2006)CrossRef
22.
go back to reference W.J. Lee, Y.S. Lee, S.K. Rha, Y.J. Lee, K.Y. Lim, Y.D. Chung, C.N. Whang, Appl. Surf. Sci. 205, 128–136 (2003)CrossRef W.J. Lee, Y.S. Lee, S.K. Rha, Y.J. Lee, K.Y. Lim, Y.D. Chung, C.N. Whang, Appl. Surf. Sci. 205, 128–136 (2003)CrossRef
23.
go back to reference D. Wolany, T. Fladung, L. Duda, J.W. Lee, T. Gantenfort, L. Wiedmann, A. Benninghoven, Surf. Interface Anal. 27, 609–617 (1999)CrossRef D. Wolany, T. Fladung, L. Duda, J.W. Lee, T. Gantenfort, L. Wiedmann, A. Benninghoven, Surf. Interface Anal. 27, 609–617 (1999)CrossRef
24.
go back to reference O.H. Abd-Elkader, N.M. Deraz, Int. J. Electrochem. Sci. 8, 8614–8622 (2013) O.H. Abd-Elkader, N.M. Deraz, Int. J. Electrochem. Sci. 8, 8614–8622 (2013)
25.
go back to reference C.S. Barrett, T.B. Massalski, Structure of Metals (Pergamon, Oxford, 1980), p. 1923 C.S. Barrett, T.B. Massalski, Structure of Metals (Pergamon, Oxford, 1980), p. 1923
26.
go back to reference E. Shinada, T. Nagoshi, T.F. Mark Chang, M. Sone, Mater. Sci. Semicond. Process. 16, 633–639 (2013)CrossRef E. Shinada, T. Nagoshi, T.F. Mark Chang, M. Sone, Mater. Sci. Semicond. Process. 16, 633–639 (2013)CrossRef
27.
go back to reference O. Gürbüz, S. Güner, Ö. Büyükbakkal, S. Çalışkan, J. Magn. Magn. Mater. 373, 90–95 (2015)CrossRef O. Gürbüz, S. Güner, Ö. Büyükbakkal, S. Çalışkan, J. Magn. Magn. Mater. 373, 90–95 (2015)CrossRef
28.
go back to reference T. Hara, H. Toida, Y. Shimura, Electrochem. Solid State Lett. 6(7), G98–G100 (2003)CrossRef T. Hara, H. Toida, Y. Shimura, Electrochem. Solid State Lett. 6(7), G98–G100 (2003)CrossRef
29.
go back to reference M. Stangl, J. Acker, V. Dittel, W. Gruner, V. Hoffmann, K. Wetzig, Microelectronic Eng. 82, 189–195 (2005)CrossRef M. Stangl, J. Acker, V. Dittel, W. Gruner, V. Hoffmann, K. Wetzig, Microelectronic Eng. 82, 189–195 (2005)CrossRef
30.
go back to reference W.B. Jang, M.B. Seo, J.C. Seo, S.G. Park, H.S. Han, Polym. Int. 57, 350–358 (2008)CrossRef W.B. Jang, M.B. Seo, J.C. Seo, S.G. Park, H.S. Han, Polym. Int. 57, 350–358 (2008)CrossRef
31.
32.
go back to reference R. Huang, W. Rob, H. Ceric, T. Detzel, G. Dehm, IEEE Trans. Device Mater. Reliab. 10, 47–54 (2010)CrossRef R. Huang, W. Rob, H. Ceric, T. Detzel, G. Dehm, IEEE Trans. Device Mater. Reliab. 10, 47–54 (2010)CrossRef
Metadata
Title
Study on Aging Effect of Adhesion Strength Between Polyimide Film and Copper Layer
Authors
Seok-Bon Koo
Chang-Myeon Lee
Sang-Jun Kwon
Jun-Mi Jeon
Jin-young Hur
Hong-Kee Lee
Publication date
28-07-2018
Publisher
The Korean Institute of Metals and Materials
Published in
Metals and Materials International / Issue 1/2019
Print ISSN: 1598-9623
Electronic ISSN: 2005-4149
DOI
https://doi.org/10.1007/s12540-018-0167-7

Other articles of this Issue 1/2019

Metals and Materials International 1/2019 Go to the issue

Premium Partners