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Published in: Optical and Quantum Electronics 11/2017

01-11-2017

Sub-aperture stitching method to measure aspherical mirror in phase retrieval

Authors: Chao Xie, JuanLi Ren, Shangyong Chen

Published in: Optical and Quantum Electronics | Issue 11/2017

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Abstract

A sub-aperture stitching method to measure aspherical mirror in phase retrieval is presented. Analytical expressions for the gradient of a squared-error metric with respect to the object and sub-aperture parameters are obtained. Then we give the sub-aperture stitching algorithm in phase retrieval to measure aspherical mirror. The validity of it has been proved in simulation by us. The influence of misalignment in this algorithm is shown and the corresponding method to align is supplied. Using this sub-aperture stitching method we have arranged an experimental setup to test an aspheric mirror with 640 mm vertex radius and 206 mm clear aperture. In this experiment, the optical path has been perfectly aligned using foregoing alignment method. The good agreement between the results of sub-aperture stitching and the corresponding interferometer results indicates the correction of the sub-aperture stitching approach and the corresponding aligning method.

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Literature
go back to reference Brady, G.R., Fienup, J.R.: Measurement range of phase retrieval in optical surface and wavefront metrology. Appl. Opt. 48(3), 442–449 (2009)ADSCrossRef Brady, G.R., Fienup, J.R.: Measurement range of phase retrieval in optical surface and wavefront metrology. Appl. Opt. 48(3), 442–449 (2009)ADSCrossRef
go back to reference Brady, G.R., Guizar-Sicairos, M., Fienup, J.R.: Optical wavefront measurement using phase retrieval with transverse translation diversity. Opt. Express 17(2), 624–639 (2009)ADSCrossRef Brady, G.R., Guizar-Sicairos, M., Fienup, J.R.: Optical wavefront measurement using phase retrieval with transverse translation diversity. Opt. Express 17(2), 624–639 (2009)ADSCrossRef
go back to reference Faulkner, H.M.L., Rodenburg, J.M.: Movable aperture lensless transmission microscopy: a novel phase retrieval algorithm. Phys. Rev. Lett. 93, 023903(1)–023903(4) (2004)ADSCrossRef Faulkner, H.M.L., Rodenburg, J.M.: Movable aperture lensless transmission microscopy: a novel phase retrieval algorithm. Phys. Rev. Lett. 93, 023903(1)–023903(4) (2004)ADSCrossRef
go back to reference Faulkner, H.M.L., Rodenburg, J.M.: Error tolerance of an iterative phase retrieval algorithm for moveable illumination microscopy. Ultramicroscopy 103, 153–164 (2005)CrossRef Faulkner, H.M.L., Rodenburg, J.M.: Error tolerance of an iterative phase retrieval algorithm for moveable illumination microscopy. Ultramicroscopy 103, 153–164 (2005)CrossRef
go back to reference Fienup, J.R.: Phase-retrieval algorithms for a complicated optical system. Appl. Opt. 32, 1737–1746 (1993)ADSCrossRef Fienup, J.R.: Phase-retrieval algorithms for a complicated optical system. Appl. Opt. 32, 1737–1746 (1993)ADSCrossRef
go back to reference Fienup, J.R., Marron, J.C., Schulz, T.J., et al.: Hubble Space Telescope characterized by using phase-retrieval algorithms. Appl. Opt. 32(10), 1747–1767 (1993)ADSCrossRef Fienup, J.R., Marron, J.C., Schulz, T.J., et al.: Hubble Space Telescope characterized by using phase-retrieval algorithms. Appl. Opt. 32(10), 1747–1767 (1993)ADSCrossRef
go back to reference Fleig, J., Dumas, P., Murphy, P.E., et al.: An automated subaperture stitching interferometer workstation for spherical and aspherical surfaces. Proc. of SPIE 5188, 297 (2003)ADS Fleig, J., Dumas, P., Murphy, P.E., et al.: An automated subaperture stitching interferometer workstation for spherical and aspherical surfaces. Proc. of SPIE 5188, 297 (2003)ADS
go back to reference Guizar-Sicairos, M., Fienup, J.R.: Phase retrieval with transverse translation diversity: a nonlinear optimization approach. Opt. Express 16, 7264–7278 (2008)ADSCrossRef Guizar-Sicairos, M., Fienup, J.R.: Phase retrieval with transverse translation diversity: a nonlinear optimization approach. Opt. Express 16, 7264–7278 (2008)ADSCrossRef
go back to reference Redding, D., Dumont, P., Yu, J.: Hubble space telescope prescription retrieval. Appl. Opt. 32(10), 1728–1736 (1993)ADSCrossRef Redding, D., Dumont, P., Yu, J.: Hubble space telescope prescription retrieval. Appl. Opt. 32(10), 1728–1736 (1993)ADSCrossRef
go back to reference Roddier, C., Roddier, F.: Combined approach to the Hubble Space Telescope wave-front distortion analysis. Appl. Opt. 32(16), 2992–3008 (1993)ADSCrossRef Roddier, C., Roddier, F.: Combined approach to the Hubble Space Telescope wave-front distortion analysis. Appl. Opt. 32(16), 2992–3008 (1993)ADSCrossRef
go back to reference Rodenburg, J.M., Faulkner, H.M.L.: A phase retrieval algorithm for shifting illumination. Appl. Phys. Lett. 85, 4795–4797 (2004)ADSCrossRef Rodenburg, J.M., Faulkner, H.M.L.: A phase retrieval algorithm for shifting illumination. Appl. Phys. Lett. 85, 4795–4797 (2004)ADSCrossRef
go back to reference Rodenburg, J.M., Hurst, A.C., Cullis, A.G.: Transmission microscopy without lenses for objects of unlimited size. Ultramicroscopy 107, 227–231 (2007a)CrossRef Rodenburg, J.M., Hurst, A.C., Cullis, A.G.: Transmission microscopy without lenses for objects of unlimited size. Ultramicroscopy 107, 227–231 (2007a)CrossRef
go back to reference Rodenburg, J.M., Hurst, A.C., Cullis, A.G., Dobson, B.R., Pfeiffer, F., Bunk, O., David, C., Jefimovs, K., Johnson, I.: Hard-x-ray lensless imaging of extended objects. Phys. Rev. Lett. 98, 034801 (2007b)ADSCrossRef Rodenburg, J.M., Hurst, A.C., Cullis, A.G., Dobson, B.R., Pfeiffer, F., Bunk, O., David, C., Jefimovs, K., Johnson, I.: Hard-x-ray lensless imaging of extended objects. Phys. Rev. Lett. 98, 034801 (2007b)ADSCrossRef
go back to reference Wang, X., Wang, L., Yin, L., et al.: Measurement of large aspheric surfaces by annular subaperture stitching interferometry. Chin. Opt. Lett. 5(11), 645–647 (2007)ADS Wang, X., Wang, L., Yin, L., et al.: Measurement of large aspheric surfaces by annular subaperture stitching interferometry. Chin. Opt. Lett. 5(11), 645–647 (2007)ADS
go back to reference Zhang, P., Zhao, H., Zhou, X., et al.: Sub-aperture stitching interferometry using stereovision positioning technique. Opt. Express 18(14), 15216–15222 (2010)ADSCrossRef Zhang, P., Zhao, H., Zhou, X., et al.: Sub-aperture stitching interferometry using stereovision positioning technique. Opt. Express 18(14), 15216–15222 (2010)ADSCrossRef
Metadata
Title
Sub-aperture stitching method to measure aspherical mirror in phase retrieval
Authors
Chao Xie
JuanLi Ren
Shangyong Chen
Publication date
01-11-2017
Publisher
Springer US
Published in
Optical and Quantum Electronics / Issue 11/2017
Print ISSN: 0306-8919
Electronic ISSN: 1572-817X
DOI
https://doi.org/10.1007/s11082-017-1189-y

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