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2019 | OriginalPaper | Chapter

3. Technical Aspects of Atomic Force Microscopy

Author : Bert Voigtländer

Published in: Atomic Force Microscopy

Publisher: Springer International Publishing

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Abstract

In order to perform nanoscale motions in AFM (e.g. during scanning) very precise actuators are required. Piezoelectric actuators achieve the required precision. We describe the principles of operation of these actuators and present examples of specific actuators. In the following principles of vibration isolation are considered, because the amplitude of floor vibrations is much larger than the desired amplitude of the tip-sample vibrations.

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previous chapter Harmonic Oscillator

next chapter Atomic Force Microscopy Designs

In tables sometimes also the elastic compliance S is used, which corresponds to the reciprocal of Young’s modulus.

In this simplified consideration, we have left out the formation energy of domain walls which results in the formation of larger domains. Larger domains mean less domain wall energy. A further contribution in the energy balance is the build up of mechanical strain inside the domains when an external electric field is applied.

Note that accelerometers often measure the root mean square (RMS) amplitude which is smaller than the peak amplitude by a factor of \(1/\sqrt{2}\).

W. Heywang, K. Lubitz, W. Wersing (eds.), Piezoelectricity, 1st edn. (Springer, Heidelberg, 2008). https://doi.org/10.1007/978-3-540-68683-5

PI Ceramic GmbH, Lindenstrasse, 07589 Lederhose, Germany. http://www.piceramic.com

K.G. Vandervoort, R.K. Zasadzinski, G.G. Galicia, G.W. Crabtree, Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT-5A for use in scanning tunneling microscopes. Rev. Sci. Instrum. 64, 896 (1994). https://doi.org/10.1063/1.1144139

C. Wei, A circular arc bending model of piezoelectric tube scanners. Rev. Sci. Instrum. 67, 2286 (1998). https://doi.org/10.1063/1.1146934

M. Hannss, W. Naumann, R. Anton, Performance of a tiltcompensating tube scanner in atomic force microscopy. Scanning 20, 501 (1998). https://doi.org/10.1002/sca.1998.4950200703

W.D. Pilkey, Formulas for Stress, Strain and Structural Matrices, 2nd edn. (Wiley, New York, 2005). https://doi.org/10.1002/9780470172681

aixACCT Systems GmbH, Talbotstr. 25, 52068 Aachen, Germany. www.aixacct.com

P. Eaton, P. West, Atomic Force Microscopy (Oxford Universiy Press, New York, 2010)CrossRef

Title: Technical Aspects of Atomic Force Microscopy
Author: Bert Voigtländer
Publisher: Springer International Publishing
Book: Atomic Force Microscopy
Print ISBN: 978-3-030-13653-6

Electronic ISBN: 978-3-030-13654-3

Copyright Year: 2019
DOI: https://doi.org/10.1007/978-3-030-13654-3_3