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Journal of Materials Science

Published in:

01-07-2011

TEM investigation on zirconate formation and chromium poisoning in LSM/YSZ cathode

Authors: A. Hessler-Wyser, Z. Wuillemin, J. A. Schuler, A. Faes, J. Van herle

Published in: Journal of Materials Science | Issue 13/2011

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Abstract

Cell durability is a crucial technological issue for SOFC commercialization, and considerable progress has been made in recent years. A number of degradation pathways have been established, amongst which microstructural changes, poisoning effects and formation of less conductive phases. In this study, transmission electron microscopy was used to observe submicron-scale effects on selected cathode zones of an anode supported cell tested in SOFC stack repeat element configuration. The test has been performed with a dedicated segmented test bench, at 800 °C for 1900 h, which allowed to spatially resolve degradation processes, and therefore to improve their correlation with localized post-test analysis. Evidence is presented of reaction products (mainly SrZrO₃) at the LSM/YSZ interfaces as well as of contaminants, in particular Cr, but also Si. A polarized cell segment is compared to an unpolarized one, to assess any influence of cathode polarization.

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Title: TEM investigation on zirconate formation and chromium poisoning in LSM/YSZ cathode
Authors: A. Hessler-Wyser
Z. Wuillemin
J. A. Schuler
A. Faes
J. Van herle
Publication date: 01-07-2011
Publisher: Springer US
Published in: Journal of Materials Science / Issue 13/2011
Print ISSN: 0022-2461
Electronic ISSN: 1573-4803
DOI: https://doi.org/10.1007/s10853-011-5347-5

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