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Published in:
2006 | OriginalPaper | Chapter
The Bayes-Optimal Feature Extraction Procedure for Pattern Recognition Using Genetic Algorithm
Authors : Marek Kurzynski, Edward Puchala, Aleksander Rewak
Published in: Artificial Neural Networks – ICANN 2006
Publisher: Springer Berlin Heidelberg
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The paper deals with the extraction of features for statistical pattern recognition. Bayes probability of correct classification is adopted as the extraction criterion. The problem with complete probabilistic information is discussed and Bayes-optimal feature extraction procedure is presented in detail. The case of recognition with learning is also considered. As method of solution of optimal feature extraction a genetic algorithm is proposed. A numerical example demonstrating capability of proposed approach to solve feature extraction problem is presented.