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The International Journal of Advanced Manufacturing Technology

Issue 3-4/2008

Content (22 Articles)

ORIGINAL ARTICLE

Machinability issues in turning of Al-SiC (10p) metal matrix composites

N. Muthukrishnan, M. Murugan, K. Prahlada Rao

ORIGINAL ARTICLE

Numerical modeling of splashing and air entrapment in high-pressure die casting

P. Homayonifar, R. Babaei, E. Attar, S. Shahinfar, P. Davami

ORIGINAL ARTICLE

Ultrafast laser micromachining of 3C-SiC thin films for MEMS device fabrication

Ben Pecholt, Monica Vendan, Yuanyuan Dong, Pal Molian

ORIGINAL ARTICLE

Monitoring process variability using exponentially weighted moving sample variance control charts

Majid Eyvazian, S. G. Jalali Naini, A. Vaghefi

ORIGINAL ARTICLE

“Time-to-failure” prediction for a polymer-polymer swivelling joint

Muhammad Azeem Ashraf, Bijan Sobhi-Najafabadi, Özdemir Göl, D. Sugumar

ORIGINAL ARTICLE

Three-dimensional modelling of manufacturing tolerancing using the ascendant approach

Badreddine Ayadi, Bernard Anselmetti, Zoubeir Bouaziz, Ali Zghal

ORIGINAL ARTICLE

A software oriented CNC system based on Linux/RTLinux

Hua Ji, Yan Li, Jian Wang

ORIGINAL ARTICLE

Real-time P-H curve CNC interpolators for high speed cornering

Javad Jahanpour, Behnam Moetakef Imani

ORIGINAL ARTICLE

Development of a feature recognition module for tapered and curved base features

A. Arivazhagan, N. K. Mehta, P. K. Jain

ORIGINAL ARTICLE

Robust production control policies considering WIP balance and setup time in a semiconductor fabrication line

Sejung Kim, Young Hoon Lee, Taeyong Yang, Namkyu Park

ORIGINAL ARTICLE

A study of the flexible job shop scheduling problem with parallel machines and reentrant process

J. C. Chen, K. H. Chen, J. J. Wu, C. W. Chen

ORIGINAL ARTICLE

Joint determination of process mean and production run: A review

K. Tahera, W. M. Chan, R. N. Ibrahim

ORIGINAL ARTICLE

Information service of the resource node in a manufacturing grid environment

Yong Yin, Zude Zhou, Youping Chen, Yihong Long

Publisher's Erratum

Monitoring process variability using exponentially weighted moving sample variance control charts

Majid Eyvazian, S. G. Jalali Naini, A. Vaghefi

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