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2018 | OriginalPaper | Chapter

Toward Providing Automatic Program Repair by Utilizing Topic-Based Code Block Similarity

Authors : Youngjun Jeong, Kyeongsic Min, Geunseok Yang, Jung-Won Lee, Byungjeong Lee

Published in: Advances in Computer Science and Ubiquitous Computing

Publisher: Springer Singapore

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Abstract

In this paper, we propose the model for automated repair in software fault. Automated patch generation is the most important technique in these days. Genetic Programming (GP) technique is used for automatic program repair, but most of the techniques use just a source code including fault to make initial population. We propose two methods to select similar bug fixing history; using topic modeling and finding similar bugs by using code block similarity.

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Literature
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Yang, G., Baek, S., Lee, J., Lee, B.: Analyzing emotion words to predict severity of software bugs: a case study of open source projects. In: ACM Symposium on Applied Computing, pp. 1280–1287
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Goues, C.L., ThanhVu, N., Stephanie, F., Westley, W.: GenProg: a generic method for automatic software repair. IEEE Trans. Softw. Eng. 38(1), 54–72 (2012)CrossRef
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Kim, D., Nam, J., Song, J, Kim, S.: Automatic patch generation learned from human-written patches. In: IEEE International Conference on Software Engineering, pp. 802–811
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Yokohama, H., Higo, Y., Hotta, K., Ohta, T.: Toward improving ability to repair bugs automatically. In: ACM Symposium on Applied Computing 2016, pp. 1364–1370 (2016)
6.
Nguyen, H.D.T., Qi, D., Roychoudhury, A., Chandra, S.: SemFix: program repair via semantic analysis. In: IEEE International Conference on Software Engineering, pp. 772–781
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Metadata
Title
Toward Providing Automatic Program Repair by Utilizing Topic-Based Code Block Similarity
Authors
Youngjun Jeong
Kyeongsic Min
Geunseok Yang
Jung-Won Lee
Byungjeong Lee
Copyright Year
2018
Publisher
Springer Singapore
Book
Advances in Computer Science and Ubiquitous Computing

Print ISBN: 978-981-10-7604-6

Electronic ISBN: 978-981-10-7605-3

Copyright Year: 2018

DOI
https://doi.org/10.1007/978-981-10-7605-3_200