Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 20/2019

10-10-2019

A comparative analysis on the dye degradation efficiency of pure, Co, Ni and Mn-doped CuO nanoparticles

Authors: A. Pramothkumar, N. Senthilkumar, K. C. Mercy Gnana Malar, M. Meena, I. Vetha Potheher

Published in: Journal of Materials Science: Materials in Electronics | Issue 20/2019

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

Pure, Co, Mn and Ni (1.0 wt%) doped CuO Nanoparticles (NPs) are synthesized by co-precipitation method for the catalytic property analysis. The powder X-ray diffraction pattern of pure, Co, Mn and Ni doped CuO NPs shows that the Co2+, Mn2+ and Ni2+ ions are successfully substituted to Cu2+ ion. Fourier transform infrared spectroscopy studies confirms the functional groups present in the synthesized samples. The band gap of pure CuO NPs is increased from 3.230 to 3.256 eV and 3.274 eV by adding the dopants Co and Ni. Whereas, the addition of Mn decreases the band gap to 3.207 eV. Scanning electron microscopy images show the considerable change in morphology from the nonuniform surface of nanostructure to nano flakes when Co, Mn and Ni are added as dopants. From photoluminescence spectrum, the broad green emission is observed at 521 nm. The electrical properties of synthesized materials are studied and compared by dielectric constant, dielectric loss and ac conductivity measurements. The electrochemical impedance properties of the prepared samples were also investigated. The degradation of environmental pollutants such as 4-Nitrophenol and Methylene blue dyes are analyzed by studying the catalytic activity of the synthesized material and reported.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference A. Arulraj, S. Govindan, S. Vadivel, B. Subramanian, J. Mater. Sci.: Mater. Electron. 28, 18455 (2017) A. Arulraj, S. Govindan, S. Vadivel, B. Subramanian, J. Mater. Sci.: Mater. Electron. 28, 18455 (2017)
4.
go back to reference N. Senthil Kumar, M. Ganapathy, A. Arulraj, M. Meena, M. Vimalan, I. Vetha Potheher, J. Alloys Compd. 750, 171 (2018)CrossRef N. Senthil Kumar, M. Ganapathy, A. Arulraj, M. Meena, M. Vimalan, I. Vetha Potheher, J. Alloys Compd. 750, 171 (2018)CrossRef
5.
go back to reference M.R. Awual, M.M. Hasan, A. Shahat, A. Khalegae, Chem. Eng. J. 265, 368 (2016)CrossRef M.R. Awual, M.M. Hasan, A. Shahat, A. Khalegae, Chem. Eng. J. 265, 368 (2016)CrossRef
7.
go back to reference Y. Yongsong, T. Youchao, R. Qinfeng, D. Xiaojun, X. Lanlan, L. Jialin, J. Sol. Stat. Chem. 182, 182 (2009)CrossRef Y. Yongsong, T. Youchao, R. Qinfeng, D. Xiaojun, X. Lanlan, L. Jialin, J. Sol. Stat. Chem. 182, 182 (2009)CrossRef
8.
go back to reference G. Sharma, D. Pathania, M. Naushad, N.C. Kothiyal, Chem. Eng. J251, 413 (2013) G. Sharma, D. Pathania, M. Naushad, N.C. Kothiyal, Chem. Eng. J251, 413 (2013)
9.
go back to reference N. Senthil Kumar, M. Ganapathy, S. Sharmila, M. Shankar, M. Vimalan, I. Vetha Potheher, J. Alloys Compd. 703, 624 (2017)CrossRef N. Senthil Kumar, M. Ganapathy, S. Sharmila, M. Shankar, M. Vimalan, I. Vetha Potheher, J. Alloys Compd. 703, 624 (2017)CrossRef
10.
go back to reference M. Asfaram, M.H.A. Ghaedi, M.H.A. Goudarzi, S. Hajatid, Eng. Chem. Res. 54, 377 (2017) M. Asfaram, M.H.A. Ghaedi, M.H.A. Goudarzi, S. Hajatid, Eng. Chem. Res. 54, 377 (2017)
11.
go back to reference H. Mazaheri, M. Ghaedi, M.H.A. Azqhandi, A. Asfaram, Phys. Chem. Chem. Phys. 19, 11299 (2017)CrossRef H. Mazaheri, M. Ghaedi, M.H.A. Azqhandi, A. Asfaram, Phys. Chem. Chem. Phys. 19, 11299 (2017)CrossRef
13.
14.
16.
go back to reference A. Senthilraja, B. Subash, B. Krishnakumar, D. Rajamanickam, M. Swaminathan, M. Shanthi, Mater. Sci. Semi. Process. 22, 83 (2014)CrossRef A. Senthilraja, B. Subash, B. Krishnakumar, D. Rajamanickam, M. Swaminathan, M. Shanthi, Mater. Sci. Semi. Process. 22, 83 (2014)CrossRef
18.
go back to reference R.N. Mariammal, K. Ramachandran, G. Kalaiselvan, A. Arumugam, B. Ranganathan, D. Sastikumar, Surf. Sci. 270, 545 (2013)CrossRef R.N. Mariammal, K. Ramachandran, G. Kalaiselvan, A. Arumugam, B. Ranganathan, D. Sastikumar, Surf. Sci. 270, 545 (2013)CrossRef
20.
go back to reference K. VallalPeruman, M. Mahendran, S. Seenithurai, R. Chokkalingam, R.K. Singh, V. Chandrasekaran, J. Phys. Chem. Sol. 71, 1540 (2010)CrossRef K. VallalPeruman, M. Mahendran, S. Seenithurai, R. Chokkalingam, R.K. Singh, V. Chandrasekaran, J. Phys. Chem. Sol. 71, 1540 (2010)CrossRef
24.
go back to reference S. Kuriakose, D.K. Avasthi, S. Mohapatra, Beilstein J. Nanotechnol. 6, 928 (2015)CrossRef S. Kuriakose, D.K. Avasthi, S. Mohapatra, Beilstein J. Nanotechnol. 6, 928 (2015)CrossRef
26.
27.
go back to reference M.H. Chou, S.B. Liu, C.Y. Huang, S.Y. Wu, C.L. Cheng, Appl. Surf. Sci. 254, 7539 (2008)CrossRef M.H. Chou, S.B. Liu, C.Y. Huang, S.Y. Wu, C.L. Cheng, Appl. Surf. Sci. 254, 7539 (2008)CrossRef
28.
go back to reference K. Borgohain, J.B. Singh, M.V.R. Rao, T. Shripathi, S. Mahamuni, Phys. Rev. B 61, 11093 (2000)CrossRef K. Borgohain, J.B. Singh, M.V.R. Rao, T. Shripathi, S. Mahamuni, Phys. Rev. B 61, 11093 (2000)CrossRef
29.
go back to reference G. Adamopoulos, A. Bashir, W.P. Gillin, S. Georgakopoulos, M. Shkunov, M.A. Baklar, N. Stingelin, D.D.C. Bradley, T.D. Anthopoulos, Adv. Funct. Mater. 21, 525 (2011)CrossRef G. Adamopoulos, A. Bashir, W.P. Gillin, S. Georgakopoulos, M. Shkunov, M.A. Baklar, N. Stingelin, D.D.C. Bradley, T.D. Anthopoulos, Adv. Funct. Mater. 21, 525 (2011)CrossRef
30.
go back to reference Z. Yang, C.K. Chiang, H.T. Chang, Nano Technol. 19, 25604 (2008) Z. Yang, C.K. Chiang, H.T. Chang, Nano Technol. 19, 25604 (2008)
32.
go back to reference A. El-Trass, H. El-Shamy, I. El-Mehasseb, M. El-Kemary, Appl. Surf. Sci. 258, 2997 (2012)CrossRef A. El-Trass, H. El-Shamy, I. El-Mehasseb, M. El-Kemary, Appl. Surf. Sci. 258, 2997 (2012)CrossRef
36.
go back to reference S. Abed, H. Bougharraf, Z. Bouchouit, B. Sofiani, M.S. Derkowska-Zielinska, B. Aida, S. Sahraoui, Suplatt. Micstruct. 85, 370 (2015) S. Abed, H. Bougharraf, Z. Bouchouit, B. Sofiani, M.S. Derkowska-Zielinska, B. Aida, S. Sahraoui, Suplatt. Micstruct. 85, 370 (2015)
37.
go back to reference P. Vijayakumar, G. Anandha Babu, P. Ramasamy, Mater. Res. Bull. 47, 957 (2012)CrossRef P. Vijayakumar, G. Anandha Babu, P. Ramasamy, Mater. Res. Bull. 47, 957 (2012)CrossRef
39.
go back to reference Z.D. Pozun, S.E. Rodenbusch, E. Keller, K. Tran, W. Tang, K.J. Stevenson, G. Henkelman, J. Phys. Chem. C 117, 7598 (2013)CrossRef Z.D. Pozun, S.E. Rodenbusch, E. Keller, K. Tran, W. Tang, K.J. Stevenson, G. Henkelman, J. Phys. Chem. C 117, 7598 (2013)CrossRef
42.
go back to reference J.F. Huang, S. Vongehr, S.C. Tang, H.M. Lu, X.K. Meng, J. Phys. Chem C. 114, 15005 (2010)CrossRef J.F. Huang, S. Vongehr, S.C. Tang, H.M. Lu, X.K. Meng, J. Phys. Chem C. 114, 15005 (2010)CrossRef
43.
go back to reference N.K.R. Bogireddy, K.K. Hoskote Anand, B.K. Mandal, J. Mol. Liq. 211, 868 (2015)CrossRef N.K.R. Bogireddy, K.K. Hoskote Anand, B.K. Mandal, J. Mol. Liq. 211, 868 (2015)CrossRef
44.
go back to reference R.B. Ganapuram, M. Alle, R. Dadigala, A. Dasari, V. Maragoni, V. Guttena, Inter. Nano Lett. 5, 215 (2015)CrossRef R.B. Ganapuram, M. Alle, R. Dadigala, A. Dasari, V. Maragoni, V. Guttena, Inter. Nano Lett. 5, 215 (2015)CrossRef
45.
go back to reference J. Saha, A. Begum, A. Mukherjee, S. Kumar, Sustain. Environ. Res. 27, 245 (2017)CrossRef J. Saha, A. Begum, A. Mukherjee, S. Kumar, Sustain. Environ. Res. 27, 245 (2017)CrossRef
47.
Metadata
Title
A comparative analysis on the dye degradation efficiency of pure, Co, Ni and Mn-doped CuO nanoparticles
Authors
A. Pramothkumar
N. Senthilkumar
K. C. Mercy Gnana Malar
M. Meena
I. Vetha Potheher
Publication date
10-10-2019
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 20/2019
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-019-02262-4

Other articles of this Issue 20/2019

Journal of Materials Science: Materials in Electronics 20/2019 Go to the issue