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01-06-2011 | IIB 2010

Aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy studies of epitaxial Fe/MgO/(001)Ge heterostructures

Authors: Jaume Gazquez, Maria Varela, Daniela Petti, Matteo Cantoni, Christian Rinaldi, Stefano Brivio, Riccardo Bertacco

Published in: Journal of Materials Science | Issue 12/2011

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Abstract

Aberration correction in the scanning transmission electron microscope combined with electron energy loss spectroscopy allows simultaneous mapping of the structure, the chemistry and even the electronic properties of materials in one single experiment with spatial resolutions of the order of one Ångström. Here the authors will apply these techniques to the characterization of epitaxial Fe/MgO/(001)Ge and interfaces with possible applications for tunneling junctions, and the authors will show that epitaxial MgO films can be grown on a (001)Ge substrates by molecular beam epitaxy and how it is possible to map the chemistry of interfaces with atomic resolution.

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Title: Aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy studies of epitaxial Fe/MgO/(001)Ge heterostructures
Authors: Jaume Gazquez
Maria Varela
Daniela Petti
Matteo Cantoni
Christian Rinaldi
Stefano Brivio
Riccardo Bertacco
Publication date: 01-06-2011
Publisher: Springer US
Published in: Journal of Materials Science / Issue 12/2011
Print ISSN: 0022-2461
Electronic ISSN: 1573-4803
DOI: https://doi.org/10.1007/s10853-011-5248-7

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