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Published in:
Conventional Test Methods Read chapter Read first chapter

2018 | OriginalPaper | Chapter

9. All-Silicon Optical Technology for Contactless Testing of Integrated Circuits

Author : Selahattin Sayil

Published in: Contactless VLSI Measurement and Testing Techniques

Publisher: Springer International Publishing

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Abstract

The uniqueness of the “all-silicon optical testing methodology” lies in the fact that it is fully an optical technique utilizing visible light, and it is completely compatible with standard silicon IC processing. It uses optical signals transmitted to the circuit for “inputting” the stimulus data and also uses optical signals from the circuit for observation of the logic output. In addition, this approach is fully compatible with the simultaneous use of mechanical probes for power and other signals. The approach avoids many of the limitations of other contactless techniques.

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previous chapter Probing Techniques Based on Light Emission from Chip
next chapter Comparison of Contactless Testing Methodologies
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Metadata
Title
All-Silicon Optical Technology for Contactless Testing of Integrated Circuits
Author
Selahattin Sayil
Copyright Year
2018
Book
Contactless VLSI Measurement and Testing Techniques

Print ISBN: 978-3-319-69672-0

Electronic ISBN: 978-3-319-69673-7

Copyright Year: 2018

DOI
https://doi.org/10.1007/978-3-319-69673-7_9