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Journal of Electronic Testing

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11-03-2016

Applications of Mixed-Signal Technology in Digital Testing

Authors: Baohu Li, Vishwani D. Agrawal

Published in: Journal of Electronic Testing | Issue 2/2016

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Abstract

For reducing the test application time and required tester pins per device, we propose the use of multi-valued logic (MVL) signals, which increases data rate between the device under test (DUT) and automatic test equipment (ATE). An MVL signal sends multiple bits of information per clock cycle on a physical channel. Conversion of signals between binary and MVL is accomplished by digital to analog and analog to digital converters available in the mixed-signal technology. To support MVL test application and avoid reliability issues, we add necessary modifications on ATE and DUT sides. Theoretical calculation and a prototype experiment demonstrate significant data rate increase. We integrate the proposed MVL technique into test methodologies involving reduced pin-count test (RPCT) for multi-core system-on-chip (SoC) and test compression. An actual automatic test equipment (ATE) based test of a DUT shows notable reduction in test application time with MVL test application.

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Title: Applications of Mixed-Signal Technology in Digital Testing
Authors: Baohu Li
Vishwani D. Agrawal
Publication date: 11-03-2016
Publisher: Springer US
Published in: Journal of Electronic Testing / Issue 2/2016
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI: https://doi.org/10.1007/s10836-016-5576-2

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