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2015 | OriginalPaper | Chapter

9. Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials

Authors : W. H. Doh, V. Papaefthimiou, S. Zafeiratos

Published in: Surface Science Tools for Nanomaterials Characterization

Publisher: Springer Berlin Heidelberg

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Abstract

X-ray photoelectron spectroscopy (XPS) has proved to be one of the most powerful experimental techniques for the chemical analysis of solid surfaces and nanomaterials. The use of synchrotron radiation (SR) as the excitation source of photoelectrons offers particular advantages compared to the conventional laboratory X-ray tubes and extends the capabilities of the technique. In this chapter we intend to give an overview of the synchrotron-based X-ray photoelectron spectroscopy (SR-XPS), giving emphasis to applications related to nanomaterials and, in particular, to nanoparticles (NPs).

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previous chapter Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces

next chapter Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy

Of course the number of surface atoms depends very much on the shape of the nano-object.

Nanoparticles or nanopowders or nanoclusters or nanocrystals are microscopic particles with at least one dimension less than 100 nm.

Please note that this formula is slightly modified when applied to gasses, since the work function is not defined in that case.

The distinction between soft and hard X-rays is not well defined in the literature. Soft X-rays are the lower-energy X-rays, while the higher-energy ones are referred to as hard X-rays. In this text soft X-rays are those with energies less than 1,500 eV, while those with grater energies are considered as hard X-rays.

Data are taken from the specifications of the materials science beamline, at Elettra Sincrotrone facility in Trieste, and are recorded in January 2011 (http://www.elettra.trieste.it/lightsources/elettra/elettra-beamlines/msb/beamline-description).

Here it is more appropriate to say that the kinetic energy of the Auger electrons does not depend on the photon energy, while when higher photon energy is used, it is offered as excess kinetic energy to the photoelectron peaks.

In this operation mode, the current in the storage ring is steady, while in the periodic injection operating mode, the ring current decays monotonically, between two electron injections.

http://www.quases.com/products/quases-imfp-tpp2m/

Atomic calculation of photoionization cross sections and asymmetry parameters, http://ulisse.elettra.trieste.it/services/elements/WebElements.html.

Mohai M., XPS MultiQuant user manual, 2012.

Also known as high-pressure XPS or (near) ambient pressure photoelectron spectroscopy (PES).

In the literature there are many other terms for HXPES, such as HEPES, HAXPES, and HIKE.

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Title: Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials
Authors: W. H. Doh
V. Papaefthimiou
S. Zafeiratos
Publisher: Springer Berlin Heidelberg
Book: Surface Science Tools for Nanomaterials Characterization
Print ISBN: 978-3-662-44550-1

Electronic ISBN: 978-3-662-44551-8

Copyright Year: 2015
DOI: https://doi.org/10.1007/978-3-662-44551-8_9

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